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DIM2400ESS12-A000 Datasheet(PDF) 4 Page - Dynex Semiconductor |
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DIM2400ESS12-A000 Datasheet(HTML) 4 Page - Dynex Semiconductor |
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4 / 8 page ![]() DIM2400ESS12-A000 4/8 Caution: This device is sensitive to electrostatic discharge. Users should follow ESD handling procedures. www.dynexsemi.com ELECTRICAL CHARACTERISTICS Tcase = 25°C unless stated otherwise Symbol Parameter Test Conditions Min Typ. Max Units td(off) Turn-off delay time IC = 2400A VGE = ±15V VCE = 600V RG(ON) = 1.0 RG(OFF) = 1.0 LS ~ 50nH 1370 ns tf Fall time 230 ns EOFF Turn-off energy loss 520 mJ td(on) Turn-on delay time 250 ns tr Rise time 230 ns EON Turn-on energy loss 180 mJ Qrr Diode reverse recovery charge IF = 2400A VCE = 600V dIF/dt = 9500A/μs 310 μC Irr Diode reverse recovery current 1000 A Erec Diode reverse recovery energy 150 mJ Tcase = 125°C unless stated otherwise Symbol Parameter Test Conditions Min Typ. Max Units td(off) Turn-off delay time IC = 2400A VGE = ±15V VCE = 600V RG(ON) = 1.0 RG(OFF) = 1.0 LS ~ 50nH 1570 ns tf Fall time 230 ns EOFF Turn-off energy loss 600 mJ td(on) Turn-on delay time 360 ns tr Rise time 290 ns EON Turn-on energy loss 200 mJ Qrr Diode reverse recovery charge IF = 2400A VCE = 600V dIF/dt = 8500A/μs 540 μC Irr Diode reverse recovery current 1260 A Erec Diode reverse recovery energy 260 mJ |
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