TSX631 datasheet(20/31 Pages) STMICROELECTRONICS

20 / 31 page

Application information

TSX63x, TSX63xA

20/31

DocID024293 Rev 1

Equation 5

To evaluate the op-amp reliability, a follower stress condition is used where VCC is defined

as a function of the maximum operating voltage and the absolute maximum rating (as

recommended by JEDEC rules).

The Vio drift (in µV) of the product after 1000 h of stress is tracked with parameters at

different measurement conditions (see Equation 6).

Equation 6

The long term drift parameter (ΔVio), estimating the reliability performance of the product, is

obtained using the ratio of the Vio (input offset voltage value) drift over the square root of the

calculated number of months (Equation 7).

Equation 7

where Vio drift is the measured drift value in the specified test conditions after 1000 h stress

duration.

4.5

High values of input differential voltage

In closed loop configuration, which represents the typical use of an op-amp, the input

differential voltage is low (close to Vio). However, some specific conditions can lead to

higher input differential values, such as:

•

operation in an output saturation state

•

operation at speeds higher than the device bandwidth, with output voltage dynamics

limited by slew rate.

•

use of the amplifier in a comparator configuration, hence in open loop

Use of the TSX631 in comparator configuration, especially combined with high temperature

and long duration can create a permanent drift of Vio.

All channels of the dual and quad versions of the TSX632 and TSX634 are virtually

unaffected when used in comparator configuration.

4.6

PCB layouts

For correct operation, it is advised to add 10 nF decoupling capacitors as close as possible

to the power supply pins.

Months

AF 1000 h

12 months

24 h

365.25 days

()

⁄

VCC

maxVop with Vicm

VCC 2

⁄

ΔVio

Viodrift

months

()

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