AD8332ACPZ-R2 datasheet(20/56 Pages) AD

20 / 56 page

AD8331/AD8332/AD8334

Rev. G | Page 20 of 56

TEST CIRCUITS

MEASUREMENT CONSIDERATIONS

Figure 55 through Figure 68 show typical measurement

configurations and proper interface values for measurements

with 50 Ω conditions.

Short-circuit input noise measurements are made as shown in

Figure 62. The input-referred noise level is determined by

dividing the output noise by the numerical gain between Point A

and Point B and accounting for the noise floor of the spectrum

analyzer. The gain should be measured at each frequency of

interest and with low signal levels because a 50 Ω load is driven

directly. The generator is removed when noise measurements

are made.

LMD

18nF

22pF

FB*

120nH

*FERRITE BEAD

OUT

0.1µF

DUT

NETWORK ANALYZER

0.1µF

28Ω

237Ω

28Ω

1:1

50Ω

270Ω

INH

237Ω

0.1µF

Figure 55. Test Circuit—Gain and Bandwidth Measurements

10kΩ

LMD

18nF

22pF

FB*

120nH

*FERRITE BEAD

OUT

0.1µF

VGN

DUT

NETWORK ANALYZER

0.1µF

28Ω

237Ω

28Ω

1:1

50Ω

INH

237Ω

0.1µF

Figure 56. Test Circuit—Frequency Response for Various Matched Source Impedances

LMD

22pF

FB*

120nH

*FERRITE BEAD

OUT

0.1µF

VGN

DUT

NETWORK ANALYZER

0.1µF

28Ω

237Ω

28Ω

1:1

50Ω

INH

237Ω

0.1µF

Figure 57. Test Circuit—Frequency Response for Unterminated LNA, RS = 50 Ω

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