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DS26LS32MJ/883 Datasheet(PDF) 3 Page - Texas Instruments |
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DS26LS32MJ/883 Datasheet(HTML) 3 Page - Texas Instruments |
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3 / 11 page ![]() DS26LS32MQML www.ti.com SNOSAM6B – OCTOBER 2005 – REVISED APRIL 2013 Absolute Maximum Ratings (1) Supply Voltage 7V Common-Mode Range ±25V Differential Input Voltage ±25V Enable Voltage 7V Output Sink Current 50 mA Maximum Power Dissipation at 25°C (2) NFE0016A Package 1666.5 mW NAJ0020A Package 1875 mW NAD0016A Package 967.74 mW Junction Temperature (TJ) +150°C Thermal Resistance, Junction-to-Ambient θJA NFE0016A Package 100°C/W NAJ0020A Package 130°C/W NAD0016A Package 140°C/W Thermal Resistance, Junction-to-Ambient θJC See MIL-STD-1835 Storage Temperature Range −65°C to +165°C Lead Temperature (Soldering, 4 seconds) 260°C ESD Tolerance (3) 500V (1) Absolute Maximum Ratings are those values beyond which the safety of the device cannot be verified. They are not meant to imply that the device should be operated at these limits. The table of “Electrical Characteristics” provides conditions for actual device operation. (2) Derate NFE0016A, package 11.11 mW/°C above 25°C; derate NAJ0020A package 12.5 mW/°C above 25°C; derate NAD0016A Package 6.4516 mW/°C for above 25°C. (3) Human body model, 1.5k Ω in series with 100pF. Recommended Operating Conditions Supply Voltage, VCC 4.5 V to 5.5 V Temperature, TA −55°C to +125°C Quality Conformance Inspection MIL-STD-883, Method 5005 - Group A Subgroup Description Temp ( °C) 1 Static tests at +25 2 Static tests at +125 3 Static tests at -55 4 Dynamic tests at +25 5 Dynamic tests at +125 6 Dynamic tests at -55 7 Functional tests at +25 8A Functional tests at +125 8B Functional tests at -55 9 Switching tests at +25 10 Switching tests at +125 11 Switching tests at -55 Copyright © 2005–2013, Texas Instruments Incorporated Submit Documentation Feedback 3 Product Folder Links: DS26LS32MQML |
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