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台達電子工業股份有限公司

台達電子工業股份有限公司

台達電子工業股份有限公司

台達電子工業股份有限公司

Delta Electronics, Inc.

DOCUMENT

NO.

SRK330000NH

PAGE

REV.

A0

THIS DRAWINGS AND SPECIFICATIONS ARE THE PROPERTY OF Delta Electronics, Inc.

AND SHALL NOT BE REPRODUCED OR USED AS THE BASIS FOR THE MANUFACTURE OR SALE OF APPARATUS OR DEVICES WITHOUT PERMISSION

UNLESS OTHERWISE SPECIFIED TOLERANCES ON ﹕

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= ±

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The Engineering Specification for RLT0816

1/4W Low Resistance Chip Resistor

5-3 Endurance

Item

Specification and Requirement

Test Method (JIS 5201)

Rapid Change of

Temperature

△ R:±1.0%

Without distinct damage in

appearance

(1) Repeat 5 cycle as follow:

(-55 ± 3℃,30minutes)

→(Room temperature, 2~3

minutes)

→(+125 ± 2℃,30minutes)

→(Room temperature 2~3

minutes)

(2) Measuring resistance

1 hour after test

Moisture with Load

△ R: ±5.0%

Without distinct damage in

appearance

(1) Environment condition:

40 ± 2℃,90~95% RH

(2) Applied Voltage: rated voltage

(3) Test period: (1.5 hour ON)

→(0.5 hour OFF) cycled for

total

1,000 + 48 / - 0 hours

(4) Measuring resistance

1 hour after test

Load Life

△ R: ±5.0%

Without distinct

damage in appearance

(1) Test temperature: 70 ± 3℃

(2) Applied Voltage: rated voltage

(3) Test period: (1.5 hour ON)

→(0.5 hour OFF) cycled for

total

1,000 + 48 / - 0 hours

(4) Measuring resistance

1 hour after test

Low Temperature Store

△ R: ± 5.0%

Without distinct

damage in appearance

(1) Store temperature:

-55 ± 3℃ for total

1,000 + 48 / - 0 hours

(2) Measuring resistance

1 hour after test

High Temperature Store

△ R: ± 5.0%

Without distinct

damage in appearance

(1) Store temperature:

+125 ± 2℃ for total

1,000 + 48 / - 0 hours

(2) Measuring resistance

1 hour after test