SWCX1

S

S

C

SM1

–

20.0M

,

100

/

100

/

–

/

I

Frequency

M = MHz

C = Ceramic

Lid

Leaded

03

Surface Mount

SM1

SM2

SM3

STATEK CORPORATION 512 N. MAIN ST., ORANGE, CA 92868 714-639-7810 FAX: 714-997-1256 www.statek.com

YS

TEM

CERTIFICA

T

01

Temp. Range:

S = Customer Specified

Frequency

Stability over

Temp.Range

(in ppm)

Calibration

Tolerance

(in ppm)

SWCX1 10199 - Rev C

1. For more detailed specifications on crystals, refer to standard crystal datasheets.

2. Higher shock available.

SM or Leaded

Frequency

Range

Calibration Tolerance

@ 25°C

Frequency

Temperature Stability

Aging, first year

Vibration, survival

Standard CX

data sheet

SWCX1 (SM)

SWCX1 (03)

6.0 MHz to

250 MHz

± 100 ppm, or tighter

as required

Please refer to CX1 AT

data sheet

2 ppm Max

3,000 g peak 0.3 ms,

½ sine

20 g, 10-2,000 Hz

swept sine

10127 CX1 AT/

10107 CX1 SM AT

SM or Leaded

Frequency

Range

Motional Resistance

R1 @ 25°C

Motional Capacitance

C1 @ 25°C

Shunt Capacitance

C0 @ 25°C

Quality Factor

Q @ 25°C

Load Capacitance

CL

Drive Level

SWCX1 (SM)

SWCX1 (03)

6.0 MHz to

250 MHz

25 Ω @ 32 MHz

15 Ω @ 155.2 MHz

6.2 fF @ 32 MHz

4.0 fF @ 155.2 MHz

2.3 pF @ 32 MHz

2.3 pF @ 155.2 MHz

30 k @ 32 MHz

30 k @ 155.2 MHz

20 pF, f ≤ 50 MHz

10 pF, f > 50 MHz

500 µW Max f ≤ 50 MHz

200 µW Max f > 50 MHz

S = special or

custom design.

Blank = standard

STANDARD TESTS & SCREENING OPTIONS

Swept

Quartz

Crystal

Screening per

option code

S = Space

M = Military

E = Engineering

Total

Frequency

Tolerance

(in ppm)

Operating Temp. Range:

S = Customer Specified

OR

—

/

—

/

200

/

I

S

M

E

x

x

x

x

x

x

x

x

x

x

x

x

x

x

x

x

x

x

x

x

x

x

x

x

x

x

x

Item

Method

Comments

Made with swept quartz

Internal visual (pre-seal)

Statek internal standard

PIND testing

MIL-STD-883 Method 2020 Condition A

Performed in both the width and thickness

directions.

Radiographic inspection

MIL-STD-202 Method 209

Unwanted modes

MIL-PRF-3098

Spurious-mode ratio 2:1 or greater

Low temperature storage

MIL-PRF-3098

Resistance must meet specification at this low

temperature.

Frequency and resistance over operating

temperature range

MIL-PRF-3098

Measure every 2.5 degree C or tighter over

operating temperature range; frequency and

resistance must meet specification.

Accelerated aging

105 degree C for a minimum of 160 hours

Frequency and resistance must meet

specification after aging; maximum allowed

change in series frequency 5 ppm.

Seal test (fine leak)

MIL-STD-883 Method 1014 Condition A1

Seal test (gross leak)

MIL-STD-883 Method 1014 Condition C

Final electrical test

π-network measurement per IEC 60444

External visual (post-seal)

Statek internal standard

Code

S: For space-based applications.

M: For military applications.

E: For engineering prototypes and applications not requiring the additional screening.