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HT82P604B Datasheet(PDF) 3 Page - Holtek Semiconductor Inc |
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HT82P604B Datasheet(HTML) 3 Page - Holtek Semiconductor Inc |
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3 / 7 page ![]() Pin No. Pin Name I/O Description 12 PGOOD O PGOOD is an open collector output used to indicate the status of the converter output voltage. This pin is pulled low when the converter output is not within ±10% of the DACOUT reference voltage. Exception to this behavivor is the ¢11111¢ VID pin com- bination which disables the converter; in this case, PGOOD as- serts a high level. 13 PHASE O Connect the PHASE pin to the upper MOSFET source. This pin is used to monitor the voltage drop across the MOSFET for over-current protection. This pin also provides the return path for the upper gate drive. 14 UGATE O Connect UGATE to the upper MOSFET gate. This pin provides the gate drive for the upper MOSFET. 15 BOOT I This pin provides bias voltage to the upper MOSFET driver. A bootstrap circuit may be used to create a BOOT voltage suitable to drive a standard N-Channel MOSFET. 16 PGND P This is the power ground connection. Tie the lower MOSFET source to this pin. 17 LGATE O Connect LGATE to the lower MOSFET gate. This pin provides the gate drive for the lower MOSFET. 18 VCC P Provide a 12V bias supply for the chip to this pin. 19 OVP O The OVP pin can be used to drive an external SCR in the event of an overvoltage condition. 20 RT I This pin provides oscillator switching frequency adjustment. By placing a resistor (RT) from this pin to GND, the nominal 200kHz switching frequency is increased. FS » 200kHz + 510 R(k ) 6 T ´ W (RT to GND) Conversely, connecting a pull-up resistor (RT) from this pin to VCC reduces the switching frequency. FS » 200kHz + 410 R(k ) 7 T ´ W (RT to 12V) Absolute Maximum Ratings Supply Voltage ......................................... +15V Storage Temperature ............... -50°Cto125°C Input Voltage ............... GND-0.3 to VCC+0.3V Operating Temperature ............ -20°Cto75°C Note: These are stress ratings only. Stresses exceeding the range specified under ²Absolute Maxi- mum Ratings² may cause substantial damage to the device. Functional operation of this device at other conditions beyond those listed in the specification is not implied and prolonged expo- sure to extreme conditions may affect device reliability. HT82P604B 3 March 23, 2000 Preliminary |
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