AD5744R_15 datasheet(19/32 Pages) AD

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Data Sheet

AD5744R

Rev. E | Page 19 of 32

TERMINOLOGY

Relative Accuracy or Integral Nonlinearity (INL)

For the DAC, a measure of the maximum deviation, in LSBs,

from a straight line passing through the endpoints of the DAC

transfer function.

Differential Nonlinearity (DNL)

The difference between the measured change and the ideal 1 LSB

change between any two adjacent codes. A specified differential

nonlinearity of ±1 LSB maximum ensures monotonicity. This DAC

is guaranteed monotonic.

Monotonicity

A DAC is monotonic if the output either increases or remains

constant for increasing digital input code. The AD5744R is

monotonic over its full operating temperature range.

Bipolar Zero Error

The deviation of the analog output from the ideal half-scale

output of 0 V when the data register is loaded with 0x8000

(offset binary coding) or 0x0000 (twos complement coding).

Figure 22 shows a plot of bipolar zero error vs. temperature.

Bipolar Zero Temperature Coefficient

The measure of the change in the bipolar zero error with a

change in temperature. It is expressed as parts per million of

full-scale range per degree Celsius (ppm FSR/°C).

Full-Scale Error

The measure of the output error when full-scale code is loaded

to the data register. Ideally, the output voltage should be 2 ×

VREFIN − 1 LSB. Full-scale error is expressed as a percentage of

full-scale range (% FSR).

Negative Full-Scale Error/Zero-Scale Error

The error in the DAC output voltage when 0x0000 (offset binary

coding) or 0x8000 (twos complement coding) is loaded to the

data register. Ideally, the output voltage should be −2 × VREFIN.

Figure 21 shows a plot of zero-scale error vs. temperature.

Output Voltage Settling Time

The amount of time it takes for the output to settle to a specified

level for a full-scale input change.

Slew Rate

A limitation in the rate of change of the output voltage. The output

slewing speed of a voltage output DAC is usually limited by the

slew rate of the amplifier used at its output. Slew rate is measured

from 10% to 90% of the output signal and is given in volts per

microsecond (V/μs).

Gain Error

A measure of the span error of the DAC. It is the deviation in

slope of the DAC transfer characteristic from the ideal, expressed

as a percentage of the full-scale range (% FSR). Figure 23 shows

a plot of gain error vs. temperature.

Total Unadjusted Error (TUE)

A measure of the output error, considering all the various

errors. Figure 19 shows a plot of total unadjusted error vs.

reference voltage.

Zero-Scale Error Temperature Coefficient

A measure of the change in zero-scale error with a change in

temperature. It is expressed as parts per million of full-scale

range per degree Celsius (ppm FSR/°C).

Gain Error Temperature Coefficient

A measure of the change in gain error with changes in tempera-

ture. It is expressed as parts per million of full-scale range per

degree Celsius (ppm FSR/°C).

Digital-to-Analog Glitch Energy

The impulse injected into the analog output when the input code

in the data register changes state. It is normally specified as the

area of the glitch in nanovolt-seconds (nV-sec) and is measured

when the digital input code is changed by 1 LSB at the major carry

transition (0x7FFF to 0x8000), as shown in Figure 28.

Digital Feedthrough

A measure of the impulse injected into the analog output of the

DAC from the digital inputs of the DAC but is measured when

the DAC output is not updated. It is specified in nanovolt-seconds

(nV-sec) and measured with a full-scale code change on the

data bus, that is, from all 0s to all 1s, and vice versa.

Power Supply Sensitivity

Indicates how the output of the DAC is affected by changes in

the power supply voltage.

DC Crosstalk

The dc change in the output level of one DAC in response to a

change in the output of another DAC. It is measured with a full-

scale output change on one DAC while monitoring another

DAC, and is expressed in least significant bits (LSBs).

DAC-to-DAC Crosstalk

The glitch impulse transferred to the output of one DAC due

to a digital code change and subsequent output change of

another DAC. This includes both digital and analog crosstalk.

It is measured by loading one of the DACs with a full-scale code

change (from all 0s to all 1s, and vice versa) with LDAC low and

monitoring the output of another DAC. The energy of the glitch

is expressed in nanovolt-seconds (nV-sec).

Channel-to-Channel Isolation

The ratio of the amplitude of the signal at the output of one DAC

to a sine wave on the reference input of another DAC. It is

measured in decibels (dB).

Reference Temperature Coefficient

A measure of the change in the reference output voltage with

a change in temperature. It is expressed in parts per million per

degree Celsius (ppm/°C).

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