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LTC2336-18 Datasheet(PDF) 13 Page - Linear Technology |
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LTC2336-18 Datasheet(HTML) 13 Page - Linear Technology |
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13 / 24 page ![]() LTC2336-18 13 233618f For more information www.linear.com/LTC2336-18 applicaTions inForMaTion Figure7b. Using the LTC6655-2.048 as an External Reference Figure 7c. Overdriving REFBUF Using the LTC6655-5 Figure 8. CNV waveform Showing Burst Sampling LTC2336-18 BANDGAP REFERENCE LTC6655-2.048 233618 F07b 47µF 2.7µF 6.5k REFBUF REFIN 15k 6.5k REFERENCE BUFFER GND LTC2336-18 GND BANDGAP REFERENCE LTC6655-5 233618 F07c 47µF 6.5k REFBUF REFIN 15k 6.5k REFERENCE BUFFER External Reference Unbuffered The internal reference buffer can also be overdriven from 2.5V to 5V with an external reference at REFBUF as shown in Figure 7c. So the input ranges are ±6.25V to ±12.5V, respectively, as shown in Table 3. To do so, REFIN must be grounded to disable the reference buffer. A 13k resis- tor loads the REFBUF pin when the reference buffer is disabled. To maximize the input signal swing and cor- responding SNR, the LTC6655-5 is recommended when overdrivingREFBUF.TheLTC6655-5offersthesamesmall size, accuracy, drift and extended temperature range as the LTC6655-2.048. By using a 5V reference, an SNR of 102dB can be achieved. Bypassing the LTC6655-5 with a 47μF ceramic capacitor (X5R, 0805 size) close to the REFBUF pin is recommended. TheREFBUFpinoftheLTC2336-18drawsacharge(QCONV) fromtheexternalbypasscapacitorduringeachconversion cycle. If the internal reference buffer is overdriven, the external reference must provide all of this charge with a DC current equivalent to IREFBUF = QCONV/tCYC. Thus, the DC current draw of REFBUF depends on the sampling rate and output code. In applications where a burst of samples is taken after idling for long periods, as shown in Figure 8, IREFBUF quickly goes from approximately 390µA to a maxi- mumof0.6mAforREFBUF=5Vat250ksps.ThisstepinDC current draw triggers a transient response in the external CNV IDLE PERIOD IDLE PERIOD 233618 F08 reference that must be considered since any deviation in the voltage at REFBUF will affect the accuracy of the output code. If an external reference is used to overdrive REFBUF, the fast settling LTC6655-5 reference is recommended. Internal Reference Buffer Transient Response Foroptimumtransientperformance,theinternalreference buffer should be used. The internal reference buffer uses a proprietary design that results in an output voltage change at REFBUF of less than 1LSB when responding to a sudden burst of conversions. This makes the internal reference bufferoftheLTC2336-18trulysingle-shotcapablesincethe first sample taken after idling will yield the same result as a sample taken after the transient response of the internal reference buffer has settled. Figure 9 shows the transient responses of the LTC2336-18 with the internal reference buffer and with the internal reference buffer overdriven by the LTC6655-5, both with a bypass capacitance of 47μF. DYNAMIC PERFORMANCE Fast Fourier Transform (FFT) techniques are used to test the ADC’s frequency response, distortion and noise at the ratedthroughput.Byapplyingalowdistortionsinewaveand analyzingthedigitaloutputusinganFFTalgorithm,theADC’s spectralcontentcanbeexaminedforfrequenciesoutsidethe |
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