DLPC3433 datasheet(7/62 Pages) TI1

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DLPC3433, DLPC3438

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DLPS035B – FEBRUARY 2014 – REVISED JANUARY 2016

Pin Functions – Board Level Test, Debug, and Initialization (continued)

I/O

DESCRIPTION

NAME

NUMBER

Test pin 1 (includes weak internal pulldown) – tri-stated while RESETZ is asserted low.

Sampled as an input test mode selection control approximately 1.5 µs after de-assertion of

RESETZ and then driven as an output.

Normal use: reserved for test output. Should be left open or unconnected for normal use.

TSTPT_1

R13

Note: An external pullup should not be applied to this pin to avoid putting the DLPC343x in a

test mode.

Without external pullup(2)

With external pullup(3)

Feeds TMSEL(1)

Test pin 2 (Includes weak internal pulldown) – tri-stated while RESETZ is asserted low.

Sampled as an input test mode selection control approximately 1.5 µs after de-assertion of

RESETZ and then driven as an output.

Normal use: reserved for test output. Should be left open or unconnected for normal use.

TSTPT_2

R14

Note: An external pullup should not be applied to this pin to avoid putting the DLPC343x in a

test mode.

Without external pullup(2)

With external pullup(3)

Feeds TMSEL(2)

Test pin 3 (Includes weak internal pulldown) – tri-stated while RESETZ is asserted low.

Sampled as an input test mode selection control approximately 1.5 µs after de-assertion of

TSTPT_3

R15

RESETZ and then driven as an output.

Normal use: reserved for for test output. Should be left open or unconnected for normal use.

Test pin 4 (Includes weak internal pulldown) – tri-stated while RESETZ is asserted low.

Sampled as an input test mode selection control approximately 1.5 µs after de-assertion of

TSTPT_4

P14

RESETZ and then driven as an output.

Normal use: reserved for for test output. Should be left open or unconnected for normal use.

Test pin 5 (Includes weak internal pulldown) – tri-stated while RESETZ is asserted low.

Sampled as an input test mode selection control approximately 1.5 µs after de-assertion of

TSTPT_5

P15

RESETZ and then driven as an output.

Normal use: reserved for test output. Should be left open or unconnected for normal use.

Test pin 6 (Includes weak internal pulldown) – tri-stated while RESETZ is asserted low.

Sampled as an input test mode selection control approximately 1.5 µs after de-assertion of

RESETZ and then driven as an output.

TSTPT_6

N14

Normal use: reserved for test output. should be left open or unconnected for normal use.

Alternative use: none. External logic shall not unintentionally pull this pin high to avoid putting

the DLPC343x in a test mode.

Test pin 7 (Includes weak internal pulldown) – tri-stated while RESETZ is asserted low.

Sampled as an input test mode selection control approximately 1.5 µs after de-assertion of

TSTPT_7

N15

RESETZ and then driven as an output.

Normal use: reserved for test output. should be left open or unconnected for normal use.

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