MCP8024 datasheet(12/46 Pages) MICROCHIP

12 / 46 page

MCP8024

DS20005228A-page 12

 2013 Microchip Technology Inc.

Note:

Unless otherwise indicated: TA = +25°C; Junction Temperature (TJ) is approximated by soaking the device under

test to an ambient temperature equal to the desired junction temperature. The test time is small enough such that the

rise in Junction temperature over the Ambient temperature is not significant.

FIGURE 2-7: 5V LDO Dynamic Linestep -

Falling VDD.

FIGURE 2-8: 12V LDO Dynamic Linestep -

Rising VDD.

FIGURE 2-9: 12V LDO Dynamic Linestep -

Falling VDD.

FIGURE 2-10: 5V LDO Dynamic Loadstep -

Rising Current.

FIGURE 2-11: 5V LDO Dynamic Loadstep -

Falling Current.

FIGURE 2-12: 12V LDO Dynamic Loadstep -

Rising Current.

-180

-120

-60

120

180

100

150

200

250

Time (µs)

Vin = 15V

Vin = 14V

Vout (AC)

Cin = Cout = 10 µF

Iout = 20 mA

-140

-70

140

210

280

100

150

200

250

Time (µs)

Vin = 14V

Vin = 15V

Vout (AC)

Cin = Cout = 10 µF

Iout = 20 mA

-180

-120

-60

120

180

100

150

200

250

Time (µs)

Vin = 15V

Vin = 14V

Vout (AC)

Cin = Cout = 10 µF

Iout = 20 mA

-40

-30

-20

-10

Time (ms)

Vout (AC)

Vin = 14V

Vout = 5V

Cin = Cout = 10 µF

Iout = 1 mA to 20 mA Step

-40

-30

-20

-10

Time (ms)

Vout (AC)

Vin = 14V

Vout = 5V

Cin = Cout = 10 µF

Iout = 20 mA to 1 mA Step

-40

-30

-20

-10

Time (ms)

Vout (AC)

Vin = 14V

Vout = 12V

Cin = Cout = 10 µF

Iout = 1 mA to 20 mA Step

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