AT89C51ED2-RDTIM datasheet(18/24 Pages) ATMEL

18 / 24 page

AT89C51RD2 / AT89C51ED2 QualPack

Rev. 0 – 2003 July

4.4 Device Reliability

4.4.1 Operating Life Testing

AT89C51ED2 test results are summarized in the table below.

Lot

Device Type

Test Description

Step

Result

Comment

A01948K

AT89C51ED2

PLCC 44

EFR Dynamic Life Test

12h

48h

0/300

LFR Dynamic Life Test

500h

1000h

0/100

4.4.2 ESD / Latch-up

AT89C51ED2 test results are summarized in the table below.

Lot

Device Type

Test Description

Step

Result

Comment

A01948

AT89C51ED2

PLCC 44

ESD-HBM Model

2000V

3000V

4000V

5000V

0/3

1/3

Class 2 of MIL STD 883

LATCH-UP

Over-Voltage

Power Injection

5.5v

50mW

0/5

Test done at 125°C

Classified latch-up free

4.4.3 FLASH and EEPROM Data Retention and Endurance Cycling

AT89C51ED2 test results are summarized in the table below.

Lot

Device Type

Test Description

Step

Result

Comment

A01948K

AT89C51ED2

PLCC 44

Data Retention

500h

1000h

0/50

Program / Erase

Endurance Cycling

100kc

0/30

32k USER memory

Program / Erase

Endurance Cycling

100kc

0/30

2k DATA memory

AT89C51ED2-RDTIM Datasheet(PDF) 18 Page - ATMEL Corporation

AT89C51ED2-RDTIM Datasheet(HTML) 18 Page - ATMEL Corporation

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