02 | Keysight | T3100S Series NFC Test Systems - Technical Overview

The Keysight Technologies, Inc. T3100S

Series NFC test systems are the essential

tools for testing NFC and contactless

payment devices. From chipsets to

cards, terminals, and mobile devices,

T3100S Series test systems cover all

product development phases from R&D to

pre-conformance and final certification.

Each of the T3100S Series systems is built

around the Keysight T1141A NFC Test

Set. Capable of supporting Analog RF

and Digital Protocol Testing, the T1141A

combines the functions needed to test

NFC devices:

– Scripted card and terminal emulation

– Arbitrary waveform generation

– Powerful waveform, logic, protocol,

and voltage analysis

The Keysight T3121S NFC R&D Test

System combines the T1141A with a

PC-hosted virtual front panel application.

The Keysight T3111S NFC Conformance

Test System can be configured as a

superset of the T3121S by adding a Test

Manager software application, and hosting

an expandable range of standards-based

test suites covering:

– EMV™ Level 1 PICC/Mobile and PCD

Digital Protocol

– NFC Forum Digital Protocol and

Analog RF

– NFC Forum LLCP and SNEP

– ISO 14443 and 18092 NFC Digital

Protocol and Analog RF

– ISO 15693 and 18000-3 RFID HF

Analog RF

The T3111S Test System can be expanded

with specialized EMV test accessories

and software applications from FIME to

cover EMV Level 1 PICC/Mobile and PCD

analog RF testing (www.keysight.com/

find/FIME).

When combined with the T3111S, the

optional Keysight T1142A Automatic

Positioning Robot enables accurate and

repeatable antenna positioning.

The integrated T1141A NFC Test Set forms the core of the T3111S and T3121S systems.

NFC pattern

generator

Logic, protocol

analysis & sniffer

RF and envelope

analysis

Personal computer

Standards-based

RF test suites

Standards-based

DP test suites

Virtual front panel

Virtual front panel

Test manager

Test manager

Keysight RFID/HF

test set

Terminal emulator

Card emulator

RF, logic, digital

analyzer

Optional automatic

positioning robot

Reference

pollers

Reference

listeners

Device under test

T3100S Test System components.