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DSOX2MASK Datasheet(PDF) 2 Page - Keysight Technologies

Part # DSOX2MASK
Description  Mask/Waveform Limit Testing
PDF  5 Pages
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Manufacturer  KEYSIGHT [Keysight Technologies]
Direct Link  http://www.keysight.com
Logo KEYSIGHT - Keysight Technologies

DSOX2MASK Datasheet(HTML) 2 Page - Keysight Technologies

  DSOX2MASK Datasheet HTML 1Page - Keysight Technologies DSOX2MASK Datasheet HTML 2Page - Keysight Technologies DSOX2MASK Datasheet HTML 3Page - Keysight Technologies DSOX2MASK Datasheet HTML 4Page - Keysight Technologies DSOX2MASK Datasheet HTML 5Page - Keysight Technologies  
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Features
– Test up to 270,000 waveforms per second with the industry’s
fastest hardware-accelerated mask testing technology
– Automatic mask creation using input standard
– Easily download multi-region masks and setups based on
industry standards
– Detailed pass/fail statistics
– Test to high-quality standards based on sigma
– Multiple user-selectable test criteria
If you need to validate the quality and stability of your electronic components and systems, the Keysight Technologies,
Inc. mask test option for InfiniiVision Series oscilloscopes can save you time and provide pass/fail statistics almost in-
stantly. The mask test option offers a fast and easy way to test your signals to specified standards, as well as the ability to
uncover unexpected signal anomalies, such as glitches. Mask testing on other oscilloscopes is usually based on software-
intensive processing technology, which tends to be slow.
Keysight’s InfiniiVision scopes mask test option is based on hardware-accelerated technology, meaning that InfiniiVision
Series oscilloscopes can perform up to 270,000 real-time waveform pass/fail tests per second. This makes your testing
throughput orders of magnitude faster than you can achieve on other oscilloscope mask test solutions.
Introduction
Keysight Technologies Oscilloscopes
Multiple form factors from 20 MHz to > 90 GHz | Industry leading specs | Powerful applications
Test waveforms to specified standards in seconds instead of
hours using hardware-accelerated mask testing



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