AT89C51RB2 / RC2 & T89C51IC2 QualPack

Rev. 1 – 2002 June

2

1

Table of contents

1

TABLE OF CONTENTS ....................................................................................................................................................2

2

GENERAL INFORMATION .............................................................................................................................................3

3

TECHNOLOGY INFORMATION...................................................................................................................................4

3.1

3.2

3.3

4

QUALIFICATION ..............................................................................................................................................................7

4.1

4.2

4.3

4.3.1

Electromigration.......................................................................................................................................................9

4.3.2

Hot carriers injection .............................................................................................................................................11

4.3.3

Time Dependent Dielectric Breakdown ..................................................................................................................12

4.3.4

FLASH characteristics ...........................................................................................................................................14

4.3.4.1

Cell endurance ................................................................................................................................................................. 14

4.3.4.2

Cell retention ................................................................................................................................................................... 15

4.3.4.3

Cell Read Disturb ............................................................................................................................................................ 16

4.3.4.4

Wafer probe Data retention measurement........................................................................................................................ 17

4.4

4.4.1

AT89C51RC2 tests..................................................................................................................................................18

4.4.2

AT89C51RC2 reliability calculation ......................................................................................................................19

4.5

4.6

5

ENVIRONMENTAL INFORMATION ..........................................................................................................................21

6

OTHER DATA ..................................................................................................................................................................22

6.1

6.2

6.3