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LMC2001ACM5 Datasheet(PDF) 3 Page - National Semiconductor (TI) |
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LMC2001ACM5 Datasheet(HTML) 3 Page - National Semiconductor (TI) |
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3 / 11 page ![]() AC Electrical Characteristics T J = 25˚C, V + = 5V, V - = 0V, V CM = 2.5V, VO = 2.5V, and RL > 1MΩ. Symbol Parameter Conditions Typ (Note 5) Units SR Slew Rate A V = +1, Vin=3.5Vpp 5 V/µs GBW Gain-Bandwidth Product 6 MHz θ m Phase Margin 75 Deg G m Gain Margin 12 dB e n Input-Referred Voltage Noise f = 0.1Hz 85 nV/ e np-p Input-Referred Voltage Noise R S = 100Ω, DC to 10Hz 1.6 µVpp i n Input-Referred Current Noise f = 0.1Hz 180 fA/ THD Total Harmonic Distortion f = 1kHz, Av = -2 R L = 10kΩ,VO = 4.5Vpp 0.02 % trec Input Overload Recovery Time 50 ms T S Output Settling time (Note 10) A V= +1, 1V step 1% 250 ns 0.1% 400 0.01% 3200 (Note 10)A V= −1, 1V step 1% 80 0.1% 860 0.01% 1400 Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is in- tended to be functional, but specific performance is not guaranteed. For guaranteed specifications and test conditions, see the Electrical Characteristics. Note 2: Human body model, 1.5k Ω in series with 100pF. Machine model, 200Ω in series with 100pF. Note 3: Output currents in excess of ±30mA over long term may adversely affect reliability. Note 4: The maximum power dissipation is a function of TJ(max), θ JA, and TA. The maximum allowable power dissipation at any ambient temperature is PD =(TJ(max) -TA)/θ JA. All numbers apply for packages soldered directly onto a PC board. Note 5: Typical values represent the most likely parametric norm. Note 6: All limits are guaranteed by testing or statistical analysis, unless otherwise noted. Note 7: V+ =5V, VCM = 2.5V, and RL connected to 2.5V. For Sourcing tests, 2.5V ≤ VO ≤ 4.8V. For Sinking tests, 0.2V ≤ V O ≤ 2.5V. Note 8: Guaranteed Vos Drift is based on 280 devices operated for 1000 hrs at 150˚C (equivalent to 30 years 55ºC). Note 9: Guaranteed by design only. Note 10: Settling times shown correspond to the worse case (positive or negative step) and does not include slew time. See the Application Note section for test schematic. Note 11: The limits are set by the accuracy of high speed automatic test equipment. For the typical VOS distribution, see the curve on page 4. Note 12: Precision bench measurement of more than 300 units. More than 65% of units had less than 15nV /˚C VOS drift. www.national.com 3 |
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