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ADC10832CIWM Datasheet(PDF) 24 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part # ADC10832CIWM
Description  10-Bit Plus Sign Serial I/O A/D Converters with MUX, Sample/Hold and Reference
PDF  30 Pages
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Manufacturer  NSC [National Semiconductor (TI)]
Direct Link  http://www.national.com
Logo NSC - National Semiconductor (TI)

ADC10832CIWM Datasheet(HTML) 24 Page - National Semiconductor (TI)

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Applications Hints (Continued)
34 Optional Adjustments
341 Zero Error
The zero error of the AD converter relates to the location
of the first riser of the transfer function (see
Figure 1 ) and
can be measured by grounding the minus input and applying
a small magnitude voltage to the plus input Zero error is the
difference between actual DC input voltage which is neces-
sary to just cause an output digital code transition from
000 0000 0000 to 000 0000 0001 and the ideal
LSB value
(
LSB e 20 mV for VREF ea 4096V)
The zero error of the AD does not require adjustment If
the minimum analog input voltage value VIN(Min) is not
ground the effective ‘‘zero’’ voltage can be adjusted to a
convenient value The converter can be made to output an
all zeros digital code for this minimum input voltage by bias-
ing any minus input to VIN(Min) This is useful for either the
differential or pseudo-differential input channel configura-
tions
342 Full-Scale
The full-scale adjustment can be made by applying a differ-
ential input voltage which is 1
LSB down from the desired
analog full-scale voltage range and then adjusting the VREF
voltage (VREF e VREFa –VREFb) for a digital output code
changing from 011 1111 1110 to 011 1111 1111 In bipolar
signed operation this only adjusts the positive full scale er-
ror
343 Adjusting for an Arbitrary Analog Input
Voltage Range
If the analog zero voltage of the AD is shifted away from
ground (for example to accommodate an analog input sig-
nal which does not go to ground) this new zero reference
should be properly adjusted first A plus input voltage which
equals this desired zero reference plus
LSB is applied to
selected plus input and the zero reference voltage at the
corresponding minus input should then be adjusted to just
obtain the 000 0000 0000 to 000 0000 0001 code transition
The full-scale adjustment should be made with the proper
minus input voltage applied by forcing a voltage to the plus
input which is given by
VIN(a)fs adj e VMAX b 15
(VMAX b VMIN)
2n
(
where VMAX equals the high end of the analog input range
VMIN equals the low end (the offset zero) of the analog
range Both VMAX and VMIN are ground referred The VREF
(VREF e VREFa b VREFb) voltage is then adjusted to pro-
vide a code change from 011 1111 1110 to 011 1111 1111
Note when using a pseudo-differential or differential multi-
plexer mode where VREFa and VREFb are placed within
the Va and GND range the individual values of VREF and
VREFb do not matter only the difference sets the analog
input voltage span This completes the adjustment proce-
dure
35 The Input Sample and Hold
The ADC10831248’s samplehold capacitor is imple-
mented in the capacitor array After the channel address is
loaded the array is switched to sample the selected positive
analog input The sampling period for the assigned positive
input is maintained for the duration of the acquisition time
(tA) 45 clock cycles
This acquisition window of 45 clock cycles is available to
allow the voltage on the capacitor array to settle to the posi-
tive analog input voltage Any change in the analog voltage
on a selected positive input before or after the acquisition
window will not effect the AD conversion result
In the simplest case the array’s acquisition time is deter-
mined by the RON (3 kX) of the multiplexer switches the
stray input capacitance CS1 (35 pF) and the total array (CL)
and stray (CS2) capacitance (48 pF) For a large source
resistance the analog input can be modeled as an RC net-
work as shown in
Figure 14 The values shown yield an
acquisition time of about 11 ms for 10-bit unipolar or 10-bit
plus sign accuracy with a zero-to-full-scale change in the
input voltage External source resistance and capacitance
will lengthen the acquisition time and should be accounted
for Slowing the clock will lengthen the acquisition time
thereby allowing a larger external source resistance
TLH11391 – 29
FIGURE 14 Analog Input Model
The signal-to-noise ratio of an ideal AD is the ratio of the
RMS value of the full scale input signal amplitude to the
value of the total error amplitude (including noise) caused
by the transfer function of the ideal AD An ideal 10-bit plus
sign AD converter with a total unadjusted error of 0 LSB
would have a signal-to-(noise a distortion) ratio of about 68
dB which can be derived from the equation
S(N a D) e 602(n) a 18
where S(N a D) is in dB and n is the number of bits
24



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