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ADC10832CIWM Datasheet(PDF) 24 Page - National Semiconductor (TI) |
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ADC10832CIWM Datasheet(HTML) 24 Page - National Semiconductor (TI) |
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24 / 30 page ![]() Applications Hints (Continued) 34 Optional Adjustments 341 Zero Error The zero error of the AD converter relates to the location of the first riser of the transfer function (see Figure 1 ) and can be measured by grounding the minus input and applying a small magnitude voltage to the plus input Zero error is the difference between actual DC input voltage which is neces- sary to just cause an output digital code transition from 000 0000 0000 to 000 0000 0001 and the ideal LSB value ( LSB e 20 mV for VREF ea 4096V) The zero error of the AD does not require adjustment If the minimum analog input voltage value VIN(Min) is not ground the effective ‘‘zero’’ voltage can be adjusted to a convenient value The converter can be made to output an all zeros digital code for this minimum input voltage by bias- ing any minus input to VIN(Min) This is useful for either the differential or pseudo-differential input channel configura- tions 342 Full-Scale The full-scale adjustment can be made by applying a differ- ential input voltage which is 1 LSB down from the desired analog full-scale voltage range and then adjusting the VREF voltage (VREF e VREFa –VREFb) for a digital output code changing from 011 1111 1110 to 011 1111 1111 In bipolar signed operation this only adjusts the positive full scale er- ror 343 Adjusting for an Arbitrary Analog Input Voltage Range If the analog zero voltage of the AD is shifted away from ground (for example to accommodate an analog input sig- nal which does not go to ground) this new zero reference should be properly adjusted first A plus input voltage which equals this desired zero reference plus LSB is applied to selected plus input and the zero reference voltage at the corresponding minus input should then be adjusted to just obtain the 000 0000 0000 to 000 0000 0001 code transition The full-scale adjustment should be made with the proper minus input voltage applied by forcing a voltage to the plus input which is given by VIN(a)fs adj e VMAX b 15 (VMAX b VMIN) 2n ( where VMAX equals the high end of the analog input range VMIN equals the low end (the offset zero) of the analog range Both VMAX and VMIN are ground referred The VREF (VREF e VREFa b VREFb) voltage is then adjusted to pro- vide a code change from 011 1111 1110 to 011 1111 1111 Note when using a pseudo-differential or differential multi- plexer mode where VREFa and VREFb are placed within the Va and GND range the individual values of VREF and VREFb do not matter only the difference sets the analog input voltage span This completes the adjustment proce- dure 35 The Input Sample and Hold The ADC10831248’s samplehold capacitor is imple- mented in the capacitor array After the channel address is loaded the array is switched to sample the selected positive analog input The sampling period for the assigned positive input is maintained for the duration of the acquisition time (tA) 45 clock cycles This acquisition window of 45 clock cycles is available to allow the voltage on the capacitor array to settle to the posi- tive analog input voltage Any change in the analog voltage on a selected positive input before or after the acquisition window will not effect the AD conversion result In the simplest case the array’s acquisition time is deter- mined by the RON (3 kX) of the multiplexer switches the stray input capacitance CS1 (35 pF) and the total array (CL) and stray (CS2) capacitance (48 pF) For a large source resistance the analog input can be modeled as an RC net- work as shown in Figure 14 The values shown yield an acquisition time of about 11 ms for 10-bit unipolar or 10-bit plus sign accuracy with a zero-to-full-scale change in the input voltage External source resistance and capacitance will lengthen the acquisition time and should be accounted for Slowing the clock will lengthen the acquisition time thereby allowing a larger external source resistance TLH11391 – 29 FIGURE 14 Analog Input Model The signal-to-noise ratio of an ideal AD is the ratio of the RMS value of the full scale input signal amplitude to the value of the total error amplitude (including noise) caused by the transfer function of the ideal AD An ideal 10-bit plus sign AD converter with a total unadjusted error of 0 LSB would have a signal-to-(noise a distortion) ratio of about 68 dB which can be derived from the equation S(N a D) e 602(n) a 18 where S(N a D) is in dB and n is the number of bits 24 |
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