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4356-RX-434 Datasheet(PDF) 4 Page - Silicon Laboratories

Part # 4356-RX-434
Description  Si4356 STANDALONE SUB-GHZ RECEIVER
PDF  26 Pages
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Manufacturer  SILABS [Silicon Laboratories]
Direct Link  http://www.silabs.com
Logo SILABS - Silicon Laboratories

4356-RX-434 Datasheet(HTML) 4 Page - Silicon Laboratories

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Si4356
4
Rev 1.2
1. Electrical Specifications
Table 1. Recommended Operating Conditions
Parameter
Symbol
Test Condition
Min
Typ
Max
Unit
Ambient Temperature
TA
–40
25
85
C
Supply Voltage
VDD
—1.8
3.6
V
I/O Drive Voltage
VGPIO
—1.8
3.6
V
Table 2. DC Characteristics*
Parameter
Symbol
Test Condition
Min
Typ
Max
Unit
Standby Mode Current
IStandby
Configuration retained, all other functions OFF
50
nA
RX Mode Current
IRX
——
12
mA
*Note:
All specifications guaranteed by production test unless otherwise noted. Production test conditions and max limits are
listed in the "Production Test Conditions" section of "1.1. Definition of Test Conditions" on page 8.
Table 3. Receiver Electrical Characteristics1
Parameter
Symbol
Test Condition
Min
Typ
Max
Unit
Frequency Range
FRANGE
Only frequencies listed in Table 9
supported
315
917
MHz
Sensitivity2
PFSK
BER < 0.1%, 2.4 kbps, (G)FSK,
Configuration = FSK1 (See Section 3.)
—–113—
dBm
PFSK
BER < 0.1%, 2.4 kbps, (G)FSK,
Configuration = FSK6 (See Section 3.)
–104
dBm
POOK
BER < 0.1%, 2.4 kbps, OOK,
Configuration = OOK6 (See Section 3.)
—–111—
dBm
RX Channel Bandwidth3
BW
100
535
kHz
BER Variation vs Power
Level3
PRX_RES
Up to +5 dBm Input Level
0
0.1
ppm
Notes:
1.
Test conditions and max limits are listed in section “1.1. Definition of Test Conditions”.
2.
Sensitivity measured at 434 MHz using a PN9 modulated input signal. Received signal is filtered, deglitched, and
retimed using an external RC filter (R = 1
k
, C = 47 nF) and MCU.
3.
Guaranteed by qualification. Qualification test conditions are listed in section “1.1. Definition of Test Conditions”.



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