ST72321R7-Auto datasheet(201/243 Pages) STMICROELECTRONICS

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ST72321xx-Auto

Electrical characteristics

Doc ID 13829 Rev 1

201/243

19.7.2

EMI (electromagnetic interference)

Based on a simple application running on the product (toggling two LEDs through the I/O

ports), the product is monitored in terms of emission. This emission test is in line with the

norm SAE J 1752/3 which specifies the board and the loading of each pin.

Table 122.

EMS test results

Symbol

Parameter

Conditions

Level/Class

VFESD

Voltage limits to be applied on any I/O pin to

induce a functional disturbance

Flash device:

VDD  5V, TA  +25°C, fOSC  8MHz,

conforms to IEC 1000-4-2

ROM device:

VDD  5V, TA  +25°C, fOSC  8 MHz,

conforms to IEC 1000-4-2

VFFTB

Fast transient voltage burst limits to be applied

through 100pF on VDD and VDD pins to induce a

functional disturbance

VDD  5V, TA  +25°C, fOSC  8 MHz,

conforms to IEC 1000-4-4

Table 123.

EMI emissions

Symbol Parameter

Conditions

Monitored

frequency band

Max vs [fOSC/fCPU]

(1)

Unit

VDD  5V, TA  +25°C,

conforming to SAE J 1752/3

8/4 MHz

16/8 MHz

SEMI

Peak level

60 Kbyte Flash devices in

LQFP64 package

0.1 MHz to 30 MHz

dBµV

30 MHz to 130 MHz

130MHz to 1GHz

SAE EMI Level

2.5

Data based on characterization results, not tested in production.

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