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L9634 Datasheet(PDF) 18 Page - STMicroelectronics

Part # L9634
Description  SQUIB RESISTANCE MEASUREMENT
PDF  36 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

L9634 Datasheet(HTML) 18 Page - STMicroelectronics

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Figure 17. Short-to-Battery Diagnostic Diagram
4.12 Open Circuit and Short to Ground Diagnostic
During an open circuit or a short to ground test, a current source referenced to VDIAG_BIAS is connected to
the SQHx. When no open circuit or short to ground condition exists, SQHx and SQLx are equal to
VDIAG_BIAS. An open circuit fault is detected when SQHx voltage is at VDIAG_BIAS and the SQLx voltage is
at ground potential. A short to ground is detected when SQLx voltage is at ground potential and the SQHx
voltage is below the open circuit threshold, OCth.
Figure 18. Open Circuit and Short to Ground Diagnostic Diagram
The open circuit and short to ground conditions are summarized in the table below. A fault condition exists
for at least tFLT_DLY before OSD sets the respective fault bit.
Table 9. Open Circuit / Short to Ground Fault Condition
4.13 Resistance Measurement
In a resistance measurement test, OSD provides a current source, ISRC, on SQHx and a current sink,
ISINK, on SQLx. The 8-bit ADC is multiplexed between the deployment loops. This ADC converts the volt-
age across the SQHx and SQLx. The conversion results is stored for SPI retrieval. Figure 19 shows the
resistance measurement diagram.
Comparator Output
Condition
OC
SG
00
Invalid State
0
1
Short to Ground
1
0
Normal operation
1
1
Open Circuit
SB
th
Diagnostics
SQLx
SQHx
VRESx
Off
Off
I
PD
gnd0
GNDx
I
BIAS
V
BIAS
Diagnostics
SQLx
SQHx
VRESx
Off
Off
SG
th
OC
th
I
PD
gnd0
GNDx
I
BIAS
V
BIAS
Obsolete
Product(s)
- Obsolete
Product(s)



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