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OX570 Datasheet(PDF) 3 Page - Advanced Crystal Technology |
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OX570 Datasheet(HTML) 3 Page - Advanced Crystal Technology |
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3 / 3 page ![]() OX570 Series Low G‐sensitivity, Sine wave, 25.8 x 25.8 x 12.7mm, Through hole device Mechanical package drawing and pin connections ACT (A wholly owned Acal BFi Company) +44 (0) 118 978 8878|sales@act.co.uk|www.act.co.uk ISO9001 Registered Specifications subject to change without notification Table 3: Environmental conditions Test IEC60068 part… IEC 60679‐1 Clause MIL‐STD‐202G Method MIL‐PRF‐810F Method MIL‐PRF‐55310D Clause Test conditions (IEC) Sealing tests (if applicable) 2‐17 5.6 112E 3.6 Gross leak: Test QC, Fine leak : Test QK Solderability resistance to soldering heat 2‐20 2‐58 5.6 208H 210F 3.6.52 3.6.48 Test Ta Method 1 Test Td1 Method 2 Test Td2 Method 2 Shock 2‐27 5.6.8 213B 516.4 3.6 Test Ea, 3 x per axes 100g, 6 ms half sine pulse Vibration, sinusoidal 2‐6 5.6.7.1 201A 204D 516.4‐4 3.6.38.1 3.6.38.2 Test Fc, 30 min per axes, 10Hz ‐ 55Hz 0, 75mm; 55Hz‐2kHz, 10g Vibration, random 2‐64 5.6.7.3 214A 514.5 3.6.38.3 3.6.38.4 Test Fdb Endurance Tests ‐Ageing ‐ extened aging 5.7.1 5.7.2 108A 4.8 30 days @ 85°C, OCXO @ 25°C 1000h, 2000h, 8000h @ 85°C Drawing control: (Internal use only) Issue number : 1 Date : 01/06/2017 Internal reference : O1 |
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