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DMN95H2D2HCTI Datasheet(PDF) 2 Page - Diodes Incorporated |
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DMN95H2D2HCTI Datasheet(HTML) 2 Page - Diodes Incorporated |
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2 / 7 page ![]() DMN95H2D2HCTI Document number: DS39275 Rev. 2 - 2 2 of 7 www.diodes.com June 2017 © Diodes Incorporated DMN95H2D2HCTI Maximum Ratings (@TA = +25°C, unless otherwise specified.) Characteristic Symbol Value Unit Drain-Source Voltage VDSS 950 V Gate-Source Voltage VGSS ±30 V Continuous Drain Current (Note 5) VGS = 10V TC = +25°C TC = +100°C ID 6 4 A Pulsed Drain Current (Note 6) IDM 24 A L = 60mH IAS 3.5 A L = 60mH EAS 360 mJ Thermal Characteristics Characteristic Symbol Max Unit Power Dissipation (Note 5) TC = +25°C TC = +100°C PD 40 14 W Thermal Resistance, Junction to Case (Note 5) TC = +25°C RθJC 3.6 °C/W Operating and Storage Temperature Range TJ, TSTG -55 to +150 °C Electrical Characteristics (@TA = +25°C, unless otherwise specified.) Characteristic Symbol Min Typ Max Unit Test Condition OFF CHARACTERISTICS (Note 8) Drain-Source Breakdown Voltage BVDSS 950 V VGS = 0V, ID = 250µA Zero Gate Voltage Drain Current IDSS 1 µA VDS = 950V, VGS = 0V Gate-Source Leakage IGSS 100 nA VGS = ±30V, VDS = 0V ON CHARACTERISTICS (Note 8) Gate Threshold Voltage VGS(TH) 3 4 5 V VDS = VGS, ID = 250µA Static Drain-Source On-Resistance RDS(ON) 1.7 2.2 Ω VGS = 10V, ID = 3A Diode Forward Voltage VSD 0.85 1.2 V VGS = 0V, IS = 6A DYNAMIC CHARACTERISTICS (Note 7) Input Capacitance Ciss 1487 pF VDS = 25V, f = 1MHz, VGS = 0V Output Capacitance Coss 113 Reverse Transfer Capacitance Crss 1 Gate Resistance Rg 4.7 Ω VDS = 0V, VGS = 0V, f = 1MHz Total Gate Charge Qg 20.3 nC VDD = 720V, ID = 6A, VGS = 10V Gate-Source Charge Qgs 6.4 Gate-Drain Charge Qgd 6.1 Turn-On Delay Time tD(ON) 39 ns VDD = 450V, VGS = 10V, Rg = 25Ω, ID = 6A Turn-On Rise Time tR Turn-Off Delay Time tD(OFF) Turn-Off Fall Time tF Body Diode Reverse Recovery Time tRR 607 ns IF = 6A, dI/dt = 100A/μs Body Diode Reverse Recovery Charge QRR C Notes: 5. Device mounted on infinite heatsink. 6. Device mounted on FR-4 substrate PC board, 2oz copper, with minimum recommended pad layout. 7. Guaranteed by design. Not subject to production testing. 8. Short duration pulse test used to minimize self-heating effect. |
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