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EPC2021 Datasheet(PDF) 1 Page - Espros Photonics corp |
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EPC2021 Datasheet(HTML) 1 Page - Espros Photonics corp |
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1 / 6 page ![]() eGaN® FET DATASHEET EPC2021 EPC – THE LEADER IN GaN TECHNOLOGY | WWW.EPC-CO.COM | COPYRIGHT 2019 | | 1 EPC2021 eGaN® FETs are supplied only in passivated die form with solder bumps. Die Size: 6.05 mm x 2.3 mm • High Speed DC-DC Conversion • Motor Drive • Industrial Automation • Synchronous Rectification • Inrush Protection • Class-D Audio EFFICIENT POWER CONVERSION G D S HAL EPC2021 – Enhancement Mode Power Transistor Maximum Ratings PARAMETER VALUE UNIT VDS Drain-to-Source Voltage (Continuous) 80 V Drain-to-Source Voltage (up to 10,000 5 ms pulses at 150°C) 96 ID Continuous (TA = 25°C, RθJA = 3.5°C/W) 90 A Pulsed (25°C, TPULSE = 300 µs) 420 VGS Gate-to-Source Voltage 6 V Gate-to-Source Voltage -4 TJ Operating Temperature -40 to 150 °C TSTG Storage Temperature -40 to 150 Thermal Characteristics PARAMETER TYP UNIT RθJC Thermal Resistance, Junction-to-Case 0.4 °C/W RθJB Thermal Resistance, Junction-to-Board 1.1 RθJA Thermal Resistance, Junction-to-Ambient (Note 1) 42 Note 1: RθJA is determined with the device mounted on one square inch of copper pad, single layer 2 oz copper on FR4 board. See http://epc-co.com/epc/documents/product-training/Appnote_Thermal_Performance_of_eGaN_FETs.pdf for details. All measurements were done with substrate connected to source. Static Characteristics (TJ = 25°C unless otherwise stated) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT BVDSS Drain-to-Source Voltage VGS = 0 V, ID = 1 mA 80 V IDSS Drain-Source Leakage VGS = 0 V, VDS = 64 V 0.1 0.7 mA IGSS Gate-to-Source Forward Leakage VGS = 5 V 1 9 mA Gate-to-Source Reverse Leakage VGS = -4 V 0.1 0.7 mA VGS(TH) Gate Threshold Voltage VDS = VGS, ID = 14 mA 0.8 1.4 2.5 V RDS(on) Drain-Source On Resistance VGS = 5 V, ID = 29 A 1.8 2.5 mΩ VSD Source-Drain Forward Voltage IS = 0.5 A, VGS = 0 V 1.6 V VDS , 80V RDS(on) , 2.5 mΩ ID , 90 A Gallium Nitride’s exceptionally high electron mobility and low temperature coefficient allows very low RDS(on), while its lateral device structure and majority carrier diode provide exceptionally low QG and zero QRR. The end result is a device that can handle tasks where very high switching frequency, and low on-time are beneficial as well as those where on-state losses dominate. |
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