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SCAN90004 Datasheet(PDF) 5 Page - National Semiconductor (TI) |
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SCAN90004 Datasheet(HTML) 5 Page - National Semiconductor (TI) |
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5 / 8 page ![]() Electrical Characteristics (Continued) Over recommended operating supply and temperature ranges unless other specified. Symbol Parameter Conditions Min Typ (Note 4) Max Units SWITCHING CHARACTERISTICS — SCAN FEATURES f MAX Maximum TCK Clock Frequency R L = 500 Ω, C L =35pF 25.0 MHz t S TDI to TCK, H or L 3.0 ns t H TDI to TCK, H or L 0.5 ns t S TMS to TCK, H or L 2.5 ns t H TMS to TCK, H or L 0.5 ns t W TCK Pulse Width, H or L 10.0 ns t W TRST Pulse Width, L 2.5 ns t REC Recovery Time, TRST to TCK 1.0 ns Note 4: Typical parameters are measured at VDD = 3.3V, TA = 25˚C. They are for reference purposes, and are not production-tested. Note 5: Differential output voltage VOD is defined as ABS(OUT+–OUT−). Differential input voltage VID is defined as ABS(IN+–IN−). Note 6: Output offset voltage VOS is defined as the average of the LVDS single-ended output voltages at logic high and logic low states. Note 7: Jitter is not production tested, but guaranteed through characterization on a sample basis. Note 8: Random Jitter, or RJ, is measured RMS with a histogram including 1500 histogram window hits. The input voltage = VID = 500mV, 50% duty cycle at 750MHz, tr =tf = 50ps (20% to 80%). Note 9: Deterministic Jitter, or DJ, is measured to a histogram mean with a sample size of 350 hits. The input voltage = VID = 500mV, K28.5 pattern at 1.5 Gbps, tr =tf = 50ps (20% to 80%). The K28.5 pattern is repeating bit streams of (0011111010 1100000101). Note 10: Total Jitter, or TJ, is measured peak to peak with a histogram including 3500 window hits. Stimulus and fixture jitter has been subtracted. The input voltage =VID = 500mV, 2 23-1 PRBS pattern at 1.5 Gbps, t r =tf = 50ps (20% to 80%). www.national.com 5 |
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