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UPD17P136ACT Datasheet(PDF) 34 Page - NEC |
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UPD17P136ACT Datasheet(HTML) 34 Page - NEC |
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34 / 292 page ![]() 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 CHAPTER 2 PIN FUNCTIONS 15 2.4 NOTES ON USING RESET PIN AND P1B0 PIN The RESET and P1B0 pins have a function for setting a test mode in which the internal operations of the µPD17134A subseries are tested (for IC test), in addition to the functions described in 2.1 PIN FUNCTIONS. When a voltage exceeding VDD is applied to either of these pins, the test mode is set. This means that, even during the normal operation, the test mode is set if a noise exceeding VDD is applied. As a result, the operation may not be performed normally. This is especially true if the wiring length of the RESET or P1B0 pin is too long in which case a noise may be superimposed on the wiring. Therefore, perform wiring so that noise may not be superimposed, by keeping the wiring length as short as possible. If noise is inevitable, take noise preventive measures by using an external component as illustrated below. • Connect a diode with low VF between VDD and RESET/P1B0 • Connect a capacitor between VDD and RESET/P1B0 RESET, P1B0 VDD VDD Diode with low VF RESET, P1B0 VDD VDD |
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