AFCT-57R5APZ datasheet(2/19 Pages) BOARDCOM

2 / 19 page

Digital Diagnostic Interface and Serial Identification

The 2-wire serial interface is based on ATMEL AT24C01A

series EEPROM protocol and signaling detail. Convention-

al SFP EEPROM memory, bytes 0-255 at memory address

0xA0, is organized in compliance with SFF-8074i. New

digital diagnostic information, bytes 0-255 at memory

address 0xA2, is compliant to SFF-8472. The new diag-

nostic information provides the opportunity for Predic-

tive Failure Identification, Compliance Prediction, Fault

Isolation and Component Monitoring.

The I2C accessible memory page address 0xB0 is used

internally by SFP for the test and diagnostic purposes

and it is reserved.

Predictive Failure Identification

The AFCT-57R5APZ predictive failure feature allows a host

to identify potential link problems before system perfor-

mance is impacted. Prior identification of link problems

enables a host to service an application via “fail over”

to a redundant link or replace a suspect device, main-

taining system uptime in the process. For applications

where ultra-high system uptime is required, a digital SFP

provides a means to monitor two real-time laser metrics

associated with observing laser degradation and pre-

dicting failure: average laser bias current (Tx_Bias) and

average laser optical power (Tx_Power).

Compliance Prediction

Compliance prediction is the ability to determine if an

optical transceiver is operating within its operating and

environmental requirements. AFCT-57R5APZ devices

provide real-time access to transceiver internal supply

voltage and temperature, allowing a host to identify

potential component compliance issues. Received

optical power is also available to assess compliance of

a cable plant and remote transmitter. When operating

out of requirements, the link cannot guarantee error free

transmission.

Fault Isolation

The fault isolation feature allows a host to quickly

pinpoint the location of a link failure, minimizing

downtime. For optical links, the ability to identify a fault

at a local device, remote device or cable plant is crucial

to speeding service of an installation. AFCT-57R5APZ

real-time monitors of Tx_Bias, Tx_Power, Vcc, Temperature

and Rx_Power can be used to assess local transceiver

current operating conditions. In addition, status flags

Tx_Disable and Rx Loss of Signal (LOS) are mirrored in

memory and available via the two-wire serial interface.

Component Monitoring

Component evaluation is a more casual use of the

AFCT-57R5APZ real-time monitors of Tx_Bias, Tx_Power,

Vcc, Temperature and Rx_Power. Potential uses are as

debugging aids for system installation and design, and

transceiver parametric evaluation for factory or field

qualification. For example, temperature per module can

be observed in high density applications to facilitate

thermal evaluation of blades, PCI cards and systems.

AFCT-57R5APZ Datasheet(PDF) 2 Page - Broadcom Corporation.

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