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MPC5554 Datasheet(PDF) 8 Page - Freescale Semiconductor, Inc

Part # MPC5554
Description  MPC5554 Microcontroller Product Brief
PDF  12 Pages
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Manufacturer  FREESCALE [Freescale Semiconductor, Inc]
Direct Link  http://www.freescale.com
Logo FREESCALE - Freescale Semiconductor, Inc

MPC5554 Datasheet(HTML) 8 Page - Freescale Semiconductor, Inc

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MPC5554 Microcontroller Product Brief, Rev. 2.1
Features
Freescale Semiconductor
8
– Chaining of DSI submodules
– Triggered transfer control and change in data transfer control (for reduced EMI)
•
2 enhanced serial communication interface (eSCI) modules
— UART mode provides NRZ format and half or full duplex interface
— eSCI bit rate up to 1 Mbps
— Advanced error detection, and optional parity generation and detection
— Word length programmable as 8 or 9 bits
— Separately enabled transmitter and receiver
— LIN Support
— DMA support
— Interrupt request support
•3 FlexCANs
— 64 message buffers each
— Full implementation of the CAN protocol specification, Version 2.0B
— Based on and including all existing features of the Freescale TouCAN module
— Programmable acceptance filters
— Short latency time for high priority transmit messages
— Arbitration scheme according to message ID or message buffer number
— Listen only mode capabilities
— Programmable clock source: system clock or oscillator clock
•
Nexus development interface (NDI)
— Per IEEE
®-ISTO 5001-2003
— Real time development support for e200z6 core and eTPU engines through Nexus Class 3
(some Class 4 support)
— Data trace of eDMA accesses
— Read and write access
— Configured via the IEEE
® 1149.1 (JTAG) port
— High bandwidth mode for fast message transmission
— Reduced bandwidth mode for reduced pin usage
•IEEE
® 1149.1 JTAG controller (JTAGC)
—IEEE
® 1149.1-2001 Test Access Port (TAP) interface
— A JCOMP input that provides the ability to share the TAP. Selectable modes of operation
include JTAGC/debug or normal system operation.
— A 5-bit instruction register that supports IEEE
® 1149.1-2001 defined instructions
— A 5-bit instruction register that supports additional public instructions
— 3 test data registers: bypass, boundary scan, and device identification



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