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STM32WB15CC Datasheet(PDF) 97 Page - STMicroelectronics

Part # STM32WB15CC
Description  Multiprotocol wireless 32-bit MCU Arm®-based Cortex®-M4 with FPU, Bluetooth® 5.2 radio solution
PDF  127 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STM32WB15CC Datasheet(HTML) 97 Page - STMicroelectronics

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DS13258 Rev 4
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STM32WB15CC
Electrical characteristics
115
6.3.15
I/O current injection characteristics
As a general rule, current injection to the I/O pins, due to external voltage below VSS or
above VDD (for standard, 3.3 V-capable I/O pins) should be avoided during normal product
operation. However, in order to give an indication of the robustness of the microcontroller in
cases when abnormal injection accidentally happens, susceptibility tests are performed on a
sample basis during device characterization.
Functional susceptibility to I/O current injection
While a simple application is executed on the device, the device is stressed by injecting
current into the I/O pins programmed in floating input mode. While current is injected into
the I/O pin, one at a time, the device is checked for functional failures.
The failure is indicated by an out of range parameter: ADC error above a certain limit (higher
than 5 LSB TUE), out of conventional limits of induced leakage current on adjacent pins (out
of the -5 µA / 0 µA range) or other functional failure (for example reset occurrence or
oscillator frequency deviation).
The characterization results are shown in Table 63.
Negative induced leakage current is caused by negative injection and positive induced
leakage current is caused by positive injection.
6.3.16
I/O port characteristics
General input/output characteristics
Unless otherwise specified, the parameters given in Table 64 are derived from tests
performed under the conditions summarized in Table 21: General operating conditions. All
I/Os are designed as CMOS- and TTL-compliant.
Table 62. Electrical sensitivity
Symbol
Parameter
Conditions
Class
LU
Static latch-up class
TA = +105 °C conforming to JESD78A
II
Table 63. I/O current injection susceptibility(1)
1. Evaluated by characterization, not tested in production.
Symbol
Description
Functional susceptibility
Unit
Negative
injection
Positive
injection
IINJ
Injected
current
All pins except AT0, AT1, PB0 and PB1
-5
N/A(2)
2. Injection not possible.
mA
AT0, AT1, PB0 and PB1 pins
0
0



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