ISL71040M

6. Radiation Tolerance

R34DS0001EU0101 Rev.1.01

Page 21 of 23

Dec 15, 2022

The data presented in Table 4 supports the conclusion that the ISL71040M is immune to damaging SEE for

operation at VDD = 16.5V and case temperature of 125°C when irradiated with ions of LET 43MeV·cm2/mg at

normal incidence. All of the monitored parameters exhibited variations within the reasonable accuracy of the

measurements.

6.2.4 SET Results

The first ISL71040M SET test looked for the occurrence of VOUT deviations from a static output level. The test

looked for VOUT transitioning through 2V for both IN = 1.00V and IN = 2.00V. Tests were run for both VDD =4.5V

and VDD = 13.2V. No static SET were captured for any of the four DUTs tested in all four of the static conditions.

With four parts each irradiated to 1x107 ion/cm2 at an LET of 43MeV•cm2/mg and 25°C, this put an upper bound

on the cross section for a static SET at 2.5x10-8 cm2.

The next SET testing looked for ±20ns perturbations on a 500kHz signal at the output. Both supply voltages, 4.5V

and 13.2V, were tested. At testing with 43MeV•cm2/mg silver ions, a small number of dynamic SET were found at

the 13.2V bias. Table 5 shows the results for this dynamic testing. The six SET captured spanned the pulse width

deviation from the nominal 1µs of -26ns to +17ns.

6.2.5 SET Discussion and Conclusions

The ISL71040M was found to be immune to damaging SEE when run at VDD = 16.5V and a case temperature of

125°C ±10°C with a 500kHz signal being driven into a 10nF load capacitance and irradiated with normal silver

ions for a surface LET of 43 MeV•cm2/mg. Four parts irradiated to 1x107ion/cm2 each showed no fundamental

changes in the seven monitor parameters as presented in Table 4 on page 20.

The ISL71040M exhibited no static output upsets through 2V at either VDD = 4.5V or VDD = 13.2V, or the input at

either IN = 1.00V (VIL) or IN = 2.00V (VIH). The irradiations to 1x107ion/cm2 were done with normal silver for a

surface LET of 43MeV•cm2/mg at a case temperature of approximately 25°C.

For dynamic SET defined as a ±20ns perturbation in pulse width for a 50% duty cycle 500kHz signal, a very small

cross section (≤1.5x10-7cm2 as reported in Table 5 on page 21) was found for the ISL71040M. This was

determined for 1x107ion/cm2 on each of four parts irradiated with normal incidence silver for LET of

43MeV•cm2/mg. As with the static SET testing VDD was set to both VDD = 4.5V and VDD = 13.2V with the larger

value yielding all the SET recorded. The six captured dynamic SET represented deviations of the pulse width from

the nominal 1µs spanning -26ns to +18ns.

DUT3

Pre

31.0

0.19

69

1.77

94

10.5

4.57

Post

30.4

0.21

69

1.77

85

10.5

4.57

Delta

-1.9%

10.5%

0.0%

0.0%

-9.6%

0.2%

0.0%

DUT4

Pre

32.0

0.23

69

1.79

80

10.5

4.59

Post

31.5

0.22

69

1.79

74

10.5

4.59

Delta

-1.5%

-4.3%

0.0%

0.0%

-7.5%

0.3%

0.0%

Table 5.

ISL71040M ±20ns Perturbation Counts on a 500kHz Square Wave and Cross Sections for Normal

Incidence Ions at 43MeV•cm2/mg at 25°C

43 MeV • cm2/mg

±20ns SET Counts for 500kHz

Average Cross

Section (cm2)

DUT1

DUT2

DUT3

DUT4

VDD = 4.5V

0000

<2.5 x 10-8

VDD = 13.2V

1401

1.5 x 10-7

Table 4.

ISL71040M SEB/L Results (VDD = 16.5V, LET = 43MeV • cm2/mg at 1x107ions/cm2,

TCASE = 125°C ±10°C) (Continued)

VDD = 16.5V

IDD

500kHz (mA)

IIN at

IN = 0V (nA)

IIN at

IN = 13.2V (µA)

IDD at

IN = 1.0V (mA)

VOUT at

IN = 1.0V (µV)

IDD at

IN = 2.0V (mA)

VOUT at

IN = 2.0V (V)