STM32H7 datasheet(166/357 Pages) STMICROELECTRONICS

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Electrical characteristics (rev Y)

STM32H742xI/G STM32H743xI/G

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DS12110 Rev 10

6.3.18

Quad-SPI interface characteristics

Unless otherwise specified, the parameters given in Table 84 and Table 85 for QUADSPI

are derived from tests performed under the ambient temperature, frcc_c_ck frequency and

VDD supply voltage conditions summarized in Table 24: General operating conditions, with

the following configuration:

•

Output speed is set to OSPEEDRy[1:0] = 11

•

Measurement points are done at CMOS levels: 0.5VDD

•

I/O compensation cell enabled

•

HSLV activated when VDD≤2.7 V

Refer to Section 6.3.15: I/O port characteristics for more details on the input/output alternate

function characteristics.

Table 84. QUADSPI characteristics in SDR mode(1)

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

Fck1/TCK

QUADSPI clock frequency

2.7 V ≤ VDD<3.6 V

CL=20 pF

133

MHz

1.62 V<VDD<3.6 V

CL=15 pF

100

tw(CKH)

QUADSPI clock high and low

time

TCK/2–0.5

TCK/2

tw(CKL)

TCK/2

TCK/2 + 0.5

ts(IN)

Data input setup time

2.7 V ≤ VDD < 3.6 V

1.62 V ≤ VDD < 3.6 V

2.5

th(IN)

Data input hold time

2.7 V ≤ VDD < 3.6 V

1.62 V ≤ VDD < 3.6 V

1.5

tv(OUT)

Data output valid time

1.5

th(OUT)

Data output hold time

0.5

1. Guaranteed by characterization results.

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