NE56632-29D datasheet(6/16 Pages) PHILIPS

Part #	NE56632-29D

Description	Active-LOW system reset with adjustable delay time

PDF	16 Pages

Scroll/Zoom	100%

Manufacturer	PHILIPS [NXP Semiconductors]

Direct Link	http://www.nxp.com

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Philips Semiconductors

Product data

NE56632-XX

Active-LOW system reset with adjustable delay time

2002 Mar 25

TYPICAL PERFORMANCE CURVES, NE56632-20

(continued)

SL01626

AMBIENT TEMPERATURE, Tamb (°C)

–40

–20

100

Test Circuit 1

VCC1 = VS(min) – 0.05 V

VCC2 = 0.4 V

VO = 0.4 V

RL = 0 Ω

S2 = ON

Figure 9. Output current (ON time 1) versus temperature.

SL01627

AMBIENT TEMPERATURE, Tamb (°C)

–40

–20

100

Test Circuit 2

CL = 100 pF

RL = 4.7 kΩ

CD = 10 nF

VCC = (VS(typ) – 0.4 V) to (VS(typ)+ 0.4 V)

tPLH = Release Delay Time

Figure 10. LOW-to-HIGH delay time versus temperature.

SL01628

AMBIENT TEMPERATURE, Tamb (°C)

–40

–20

100

105

110

115

120

Test Circuit 2

CL = 100 pF

RL = 4.7 kΩ

CD = 10 nF

VCC = (VS(typ) + 0.4 V) to (VS(typ)– 0.4 V)

tPHL = Assertion Delay Time

Figure 11. HIGH-to-LOW delay time versus temperature.

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