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MCP2150-I/SS Datasheet(PDF) 27 Page - Microchip Technology

Part # MCP2150-I/SS
Description  IrDA짰 Standard Protocol Stack Controller Supporting DTE Applications
PDF  52 Pages
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Manufacturer  MICROCHIP [Microchip Technology]
Direct Link  http://www.microchip.com
Logo MICROCHIP - Microchip Technology

MCP2150-I/SS Datasheet(HTML) 27 Page - Microchip Technology

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 2002 Microchip Technology Inc.
Preliminary
DS21655B-page 27
MCP2150
4.1
DC Characteristics
DC Specifications
Electrical Characteristics:
Standard Operating Conditions (unless otherwise specified)
Operating Temperature: -40
°C ≤ TA ≤ +85°C (industrial)
Param.
No.
Sym
Characteristic
Min
Typ(1)
Max
Units
Conditions
D001
VDD
Supply Voltage
3.0
—
5.5
V
See Figure 4-1
D002
VDR
RAM Data Retention
Voltage (2)
2.0
—
—
V
Device Oscillator/Clock stopped
D003
VPOR
VDD Start Voltage to
ensure Power-on Reset
—VSS
—V
D004
SVDD
VDD Rise Rate to
ensure Power-on Reset
0.05
—
—
V/ms
D010
IDD
Supply Current (3)
—
—
—
4.0
2.2
7.0
mA
mA
FOSC = 11.0592 MHz, VDD = 3.0 V
FOSC = 11.0592 MHz, VDD = 5.5 V
D020
IPD
Device Disabled
Current (3, 4)
—
—
—
—
2.2
9
µA
µA
VDD = 3.0 V
VDD = 5.5 V
Note 1: Data in the Typical (“Typ”) column is based on characterization results at 25
°C. This data is for design
guidance only and is not tested.
2: This is the limit to which VDD can be lowered without losing RAM data.
3: The supply current is mainly a function of the operating voltage and frequency. Pin loading, pin rate and
temperature have an impact on the current consumption.
a)
The test conditions for all IDD measurements are made when device is enabled (EN pin is high):
OSC1 = external square wave, from rail-to-rail; all input pins pulled to VSS, RXIR = VDD,
RESET = VDD;
b)
When device is disabled (EN pin is low), the conditions for current measurements are the same.
4: When the device is disabled (EN pin is low), current is measured with all input pins tied to VDD or VSS and
the output pins driving a high or low level into infinite impedance.



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