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P4C167 Datasheet(PDF) 6 Page - Pyramid Semiconductor Corporation

Part # P4C167
Description  ULTRA HIGH SPEED 16K X 1 STATIC CMOS RAMS
PDF  10 Pages
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Manufacturer  PYRAMID [Pyramid Semiconductor Corporation]
Direct Link  http://www.pyramidsemiconductor.com
Logo PYRAMID - Pyramid Semiconductor Corporation

P4C167 Datasheet(HTML) 6 Page - Pyramid Semiconductor Corporation

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P4C167
Page 6 of 10
Document # SRAM106 REV A
TIMING WAVEFORM OF WRITE CYCLE NO. 2 (CE
CE
CE
CE
CE CONTROLLED)(9)
Figure 1. Output Load
Figure 2. Thevenin Equivalent
* including scope and test fixture.
Note:
Due to the ultra-high speed of the P4C167/L, care must be taken when
testing this device; an inadequate setup can cause a normal functioning
part to be rejected as faulty. Long high-inductance leads that cause
supply bounce must be avoided by bringing the V
CC and ground planes
directly up to the contactor fingers. A 0.01 µF high frequency capacitor
is also required between V
CC and ground. To avoid signal reflections,
proper termination must be used; for example, a 50
Ω test environment
should be terminated into a 50
Ω load with 1.73V (Thevenin Voltage) at
the comparator input, and a 116
Ω resistor must be used in series with
D
OUT to match 166Ω (Thevenin Resistance).
AC TEST CONDITIONS
TRUTH TABLE
Input Pulse Levels
GND to 3.0V
Input Rise and Fall Times
3ns
Input Timing Reference Level
1.5V
Output Timing Reference Level
1.5V
Output Load
See Figures 1 and 2
Mode
CE
CE
CE
CE
CE
WE
WE
WE
WE
WE
Output
Power
Standby
H
X
High Z
Standby
Read
L
H
D
OUT
Active
Write
L
L
High Z
Active



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