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TPCP8H02 Datasheet(PDF) 1 Page - Toshiba Semiconductor

Part # TPCP8H02
Description  TOSHIBA Multi-Chip Transistor Silicon NPN Epitaxial Type, Field Effect Transistor Silicon N Channel MOS Type
PDF  8 Pages
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Manufacturer  TOSHIBA [Toshiba Semiconductor]
Direct Link  http://www.semicon.toshiba.co.jp/eng
Logo TOSHIBA - Toshiba Semiconductor

TPCP8H02 Datasheet(HTML) 1 Page - Toshiba Semiconductor

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TPCP8H02
2006-11-13
1
TOSHIBA Multi-Chip Transistor
Silicon NPN Epitaxial Type, Field Effect Transistor Silicon N Channel MOS Type
TPCP8H02
STROBE FLASH APPLICATIONS
HIGH-SPEED SWITCHING APPLICATIONS
DC-DC CONVERTER APPLICATIONS
・
Multi-chip discrete device; built-in NPN transistor for main switch and
N-ch MOS FET for drive
・
High DC current gain: hFE = 250 to 400 (IC = 0.3 A) (NPN transistor)
・
Low collector-emitter saturation voltage: VCE (sat) = 0.14 V (max)
(NPN transistor)
・
High-speed switching: tf = 25 ns (typ.) (NPN transistor)
Absolute Maximum Ratings (Ta = 25°C)
Transistor
Characteristics
Symbol
Rating
Unit
Collector-base voltage
VCBO
50
V
VCEX
50
Collector-emitter voltage
VCEO
30
V
Emitter-base voltage
VEBO
6
V
DC (Note 1)
IC
3.0
Collector current
Pulse (Note 1)
ICP
5.0
A
Base current
IB
0.3
A
Collector power dissipation (NPN)
PC (Note 2)
1.0
W
Junction temperature
Tj
150
°C
MOS FET
Characteristics
Symbol
Rating
Unit
Drain-Source Voltage
VDSS
20
V
Gate-Source Voltage
VGSS
±
10
V
DC
ID
100
Drain Current
Pulse
IDP
200
mA
Channel Temperature
Tch
150
°C
Note 1: Ensure that the junction (channel) temperature does not exceed 150℃.
Note 2: Device mounted on a glass-epoxy board (FR-4,25.4×25.4×1.6 mm , Cu area: 645 mm
2)
Note 3: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute
maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
This transistor is an electrostatic-sensitive device. Please handle with caution.
1. SOURCE
2. COLLECTOR
3. COLLECTOR
4. COLLECTOR
5. BASE
6. EMITTER
7. GATE
8. DRAIN
JEDEC
-
JEITA
-
TOSHIBA
2-3V1E
Circuit Configuration
0.33±0.05
0.28+0.1
-0.11
1.12+0.13
-0.12
0.475
0.65
A
0.05 M
2.9±0.1
4
1
5
8
0.8±0.05
0.17±0.02
B
B
0.05 M
A
S
0.025
S
1.12+0.13
-0.12
0.28+0.1
-0.11
1
2
3
4
8
7
6
5


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