RE46C191 datasheet(22/44 Pages) MICROCHIP

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RE46C191

DS20005225H-page 22

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4.4

Serial Read/Write

As an alternative to the steps in Section 4.3 “Smoke

Calibration”,

the

system

has

been

well

characterized, the limits and baseline can be entered

directly from a Serial Read/Write Calibration mode.

To enter this mode, follow these steps:

Set up the application as shown in Figure 4-1.

Drive TEST2 input from VSS to VDD to enter the

Programming mode. TEST2 remains at VDD

until all data have been entered.

Clock the TEST input to mode T7 (High = VBST,

Low = VSS, seven clocks). This enables the

Serial Read/Write mode.

TEST now acts as a data input (High = VDD,

Low = VSS). FEED acts as the clock input

(High = VBST, Low = VSS). Clock in the limits,

LTD baseline, functional and parametric options.

The data sequence follows the pattern

described in Register 4-1. A serial data output is

available at HB.

Pulse IO to store all 44 bits into the EEPROM

memory.

FIGURE 4-5:

Timing Diagram for Mode T7.

VSS

VDD

VSS

TEST2

Mode T7

– Serial Read Write

VBST

TEST

VSS

FEED

VBST

VSS

VBST

VSS

VDD

bit0

bit1

bit2

bit4

bit5

bit6

bit3

bit9

bit8

bit7

bit39

bit40 bit41

bit42

bit43

bit0

bit1

bit2

bit4

bit5

bit6

bit3

bit9

bit8

bit7

bit39

bit40

bit41

bit42

bit43

bit0

Min Tsetup2 = 2 µs

Min PW3 = 100 µs

Min T2 = 120 µs

Min PW2 = 10 ms

Min Td1 = 2 µs

Min T1 = 20 µs

Min PW1 = 10 µs

Min Thold1 = 1 µs

Min Tsetup1 = 1 µs

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