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ISL73096RHX/SAMPLE Datasheet(PDF) 1 Page - Renesas Technology Corp

Part # ISL73096RHX/SAMPLE
Description  Radiation Hardened Ultra High Frequency NPN/PNP Transistor Arrays
PDF  11 Pages
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Manufacturer  RENESAS [Renesas Technology Corp]
Direct Link  http://www.renesas.com
Logo RENESAS - Renesas Technology Corp

ISL73096RHX/SAMPLE Datasheet(HTML) 1 Page - Renesas Technology Corp

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FN6475 Rev 4.00
Page 1 of 11
June 27, 2014
FN6475
Rev 4.00
June 27, 2014
ISL73096RH, ISL73127RH, ISL73128RH, ISL73096EH, ISL73127EH,
ISL73128EH
Radiation Hardened Ultra High Frequency NPN/PNP Transistor Arrays
DATASHEET
The ISL73096, ISL73127 and ISL73128 are radiation
hardened bipolar transistor arrays. The ISL73096 consists of
three NPN transistors and two PNP transistors on a common
substrate. The ISL73127 consists of five NPN transistors on a
common substrate. The ISL73128 consists of five PNP
transistors on a common substrate.
The ISL73096EH, ISL73127EH and ISL73128EH devices
encompass all of the production testing of the ISL73096RH,
ISL73127RH and ISL73128RH devices and additionally are
tested in the Intersil Enhanced Low Dose Rate Sensitivity
(ELDERS) product manufacturing flow.
One of our bonded wafer, dielectrically isolated fabrication
processes provides an immunity to single event latch-up and
the capability of highly reliable performance in a radiation
environment.
The high gain-bandwidth product and low noise figure of these
transistors make them ideal for use in high frequency
amplifier and mixer applications. Monolithic construction of
the NPN and PNP transistors provides the closest electrical
and thermal matching possible. Access is provided to each
terminal of the transistors for maximum application flexibility.
Related Literature
• AN1503, Amplifier Design Using ISL73096RH,
ISL73127RH, ISL73128RH Transistor Arrays
• TID REPORT for the Radiation Hardened UHF NPN/PNP
transistor array
Features
• Electrically screened to SMD # 5962-07218
• QML qualified per MIL-PRF-38535 requirements
• Radiation tolerance
- High dose rate (50-300rad(Si)/s). . . . . . . . . . . 100krad(Si)
- Low dose rate (0.01rad(Si)/s) . . . . . . . . . . . . . 50krad(Si)*
- SEL immune . . . . . . . . . . Bonded wafer dielectric isolation
• NPN gain bandwidth product (FT) . . . . . . . . . . . . . . 8GHz (typ)
•NPN current gain (hFE) . . . . . . . . . . . . . . . . . . . . . . . . 130 (typ)
•NPN early voltage (VA). . . . . . . . . . . . . . . . . . . . . . . . . 50V (typ)
• PNP gain bandwidth product (FT). . . . . . . . . . . . . 5.5GHz (typ)
•PNP current gain (hFE). . . . . . . . . . . . . . . . . . . . . . . . . . 60 (typ)
•PNP early voltage (VA) . . . . . . . . . . . . . . . . . . . . . . . . . 20V (typ)
•Noise figure (50
) at 1GHz. . . . . . . . . . . . . . . . . . . 3.5dB (typ)
• Collector-to-collector leakage . . . . . . . . . . . . . . . . . . <1pA (typ)
• Complete isolation between transistors
* Limit established by characterization.
Applications
• High frequency amplifiers and mixers
•High frequency converters
•Synchronous detector
FIGURE 1. NPN BETA OVER TOTAL IONIZING DOSE (TID) FOR LOW
DOSE RATE (LDR) TO 50krads(Si) AND HIGH DOSE RATE
(HDR) TO 300krads(Si)
FIGURE 2. PNP BETA OVER TOTAL IONIZING DOSE (TID) FOR LOW
DOSE RATE (LDR) TO 50krads(Si) AND HIGH DOSE RATE
(HDR) TO 300krads(Si)
80
85
90
95
100
105
110
115
120
0
50
100
150
200
250
300
krad(Si)
40
45
50
55
60
65
70
75
0
50
100
150
200
250
300
krad(Si)


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