1

FEATURES

APPLICATIONS

DESCRIPTION

_

+

THS4302

Rf

100

Ω

49.9

Ω

VI

+

22

µF

47 pF

0.1

µF

VS+

50

Ω Source

Rg

APPLICATION CIRCUIT

VO

+

22

µF

47 pF

0.1

µF

VS-

0

2

4

6

8

10

12

14

16

10 M

100 M

1 G

10 G

f - Frequency - Hz

SMALL SIGNAL FREQUENCY RESPONSE

VO = 200 mV

RL = 100 Ω

VS = 5 V

30.1

Ω

30.1

Ω

FB

FB

FB = Ferrite Bead

THS4302

SLOS403H – OCTOBER 2002 – REVISED AUGUST 2006

www.ti.com

WIDEBAND FIXED-GAIN AMPLIFIER

• Wideband Signal Processing

2

• Fixed-Gain Amplifier, 5 V/V (14 dB)

• Wireless Transceivers

• Wide Bandwidth: 2.4 GHz

• IF Amplifier

• High Slew Rate: 5500 V/μs

• ADC Preamplifier

• Low Total Input Referred Noise: 2.8 nV/√Hz

• DAC Output Buffers

• Low Distortion

• Test, Measurement, and Instrumentation

–

HD3: -86 dBc at 30 MHz

• Medical and Industrial Imaging

–

HD3: -81 dBc at 70 MHz

–

IMD3: -88 dBc at 100 MHz

–

OIP3: 39 dBm at 100 MHz

The THS4302 device is a wideband, fixed-gain

–

IMD3: -73 dBc at 300 MHz

amplifier that offers high bandwidth, high slew rate,

low noise, and low distortion. This combination of

–

OIP3: 32 dBm at 300 MHz

specifications enables analog designers to transcend

• High Output Drive: ±180 mA

current performance limitations and process analog

• Power Supply Voltage: 3 V or 5 V

signals at much higher speeds than previously

possible with closed-loop, complementary amplifier

designs. This device is offered in a 16-pin leadless

package and incorporates a power-down mode for

quiescent power savings.

1

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

2

PowerPAD is a trademark of Texas Instruments.

PRODUCTION DATA information is current as of publication date.

Copyright © 2002–2006, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.