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HS0-117RH/SAMPLE Datasheet(PDF) 1 Page - Renesas Technology Corp

Part # HS0-117RH/SAMPLE
Description  Radiation Hardened Adjustable Positive Voltage Regulator
PDF  16 Pages
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Manufacturer  RENESAS [Renesas Technology Corp]
Direct Link  http://www.renesas.com
Logo RENESAS - Renesas Technology Corp

HS0-117RH/SAMPLE Datasheet(HTML) 1 Page - Renesas Technology Corp

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FN4560 Rev.11.01
Page 1 of 15
Aug 12, 2025
© 2001-2025 Renesas Electronics
HS-117RH, HS-117EH
Radiation Hardened Adjustable Positive Voltage Regulator
DATASHEET
The radiation hardened HS-117RH and HS-117EH are
adjustable positive voltage linear regulators capable of
operating with input voltages up to 40VDC. The HS-117EH
encompasses all of the production testing of the HS-117RH
and additionally is tested in the Enhanced Low Dose Rate
Sensitivity (ELDRS) product manufacturing flow. The output
voltage is adjustable from 1.25V to 37V with two external
resistors. The device is capable of sourcing from 5mA to 1.25A
max (0.5A max for the TO-39 package). Current protection is
provided by the on-chip thermal shutdown and output current
limiting circuitry.
The HS-117xH's advantage over other industry types is its
incorporated circuitry that minimizes the effects of radiation
and temperature on device stability.
The HS-117RH and HS-117EH are constructed in the
dielectrically isolated Rad Hard Silicon Gate (RSG) process and
are immune to single event latch-up and are specifically
designed to provide highly reliable performance in harsh
radiation environments.
Applications
• Adjustable voltage regulators
• Adjustable current regulators
Features
• Electrically screened to DLA SMD # 5962-99547
• Superior temperature stability
• Overcurrent and over-temperature protection
• Wide input voltage range . . . . . . . . . . . . . . . . . . 4.25V to 40V
• Operating temperature range. . . . . . . . . . . .-55°C to +125°C
• QML qualified per MIL-PRF-38535 requirements
• Radiation environment
- SEL/SEB LETTH (VS = 40V) . . . . . . . . . . 87.4 MeV•cm2/mg
- Total Dose, High Dose Rate . . . . . . . . . . . . . . . 300krad(Si)
- Total Dose, Low Dose Rate. . . . . . . . . . . . . . . 100krad(Si)*
* Product capability established by initial characterization. The
EH version is acceptance tested on a wafer-by-wafer basis to
50krad(Si) at low dose rate.
Related Literature
For a full list of related documents, visit our website
• HS-117RH, HS-117EH device pages
FIGURE 1. TYPICAL APPLICATION
FIGURE 2. VOUT SHIFT vs HIGH and LOW DOSE RATE RADIATION
OUTPUT
R1
R2
C1
C2
VOUT = VREF (1+R2/R1) + IADJ R2
VIN
VOUT
HS-117EH
IN
ADJUST
OUT
0
50
100
150
200
250
300
krad(Si)
-0.05
0.00
0.05
0.10
0.15
0.20
0.25
0.30
HIGH DOSE RATE
LOW DOSE RATE


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