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ADGM3144BCCZ-R2 Datasheet(PDF) 25 Page - Analog Devices

Part # ADGM3144BCCZ-R2
Description  3mm × 3mm SP4T MEMS Switch, 0Hz/DC to 30GHz
PDF  30 Pages
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Manufacturer  AD [Analog Devices]
Direct Link  http://www.analog.com
Logo AD - Analog Devices

ADGM3144BCCZ-R2 Datasheet(HTML) 25 Page - Analog Devices

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Data Sheet
ADGM3144
CRITICAL OPERATIONAL REQUIREMENTS
analog.com
Rev. 0 | 25 of 30
SYSTEM ERROR CONSIDERATIONS DUE TO
ON‑RESISTANCE DRIFT
The on-resistance (RON) performance of the ADGM3144 is affected
by part-to-part variation, channel-to-channel variation, cycle actua-
tions, settling time post turn on, bias voltage, and temperature
changes.
In a 50Ω system, the on-resistance drift over switch actuations
(∆RON) can introduce system inaccuracy. Figure 66 shows the
ADGM3144 connected with the load in a 50Ω system, where RS is
the source impedance. To calculate the system error caused by the
ADGM3144 ∆RON, use the following equation:
System Error (%) = ΔR / RLOAD
where:
ΔR is the ADGM3144 ∆RON.
RLOAD is the load impedance.
The ADGM3144 ∆RON also affects insertion loss, which must be
considered when using the device. To calculate the on-resistance
impact on insertion loss, use the following equation:
Insertion Loss = 10log (1 + (ΔR / RLOAD))
Figure 66. 50Ω System Representation Where the ADGM3144 Is Connected
with the Load
Table 9. System Error and Insertion Loss Error Due to ADGM3144 RON Drift
On-Resistance Drift
System Error
(%)
Insertion Loss Error (dB)
0.7
1.4
0.06
2
4
0.17
The ∆RON over time specification is −0.32Ω (maximum) measured
after 100ms, as shown in Figure 13 to Figure 20. According to the
plots, the RON drifts over time is −0.06Ω (typical) after 100ms. The
RON of the ADGM3144 typically drifts by −0.04Ω per decade. For
example, after 100ms, the RON drifts −0.06Ω. After 1s, the RON
drifts −0.1Ω. And after 10s, it drifts −0.14Ω. Therefore, after 1000s,
the RON is expected to drift by −0.22Ω.
ON-RESISTANCE SHIFT DUE TO
TEMPERATURE SHOCK POST ACTUATIONS
When the switch is actuated multiple times at one temperature, if
there is a sudden shift from this temperature, a large shift is shown
in the switch RON. Figure 67 shows the absolute RON performance
of the population of devices over different number of actuations.
During this measurement, the switch is actuated at 85°C and the
switch RON is measured at 25°C. Actuating the switch at 85°C
and measuring RON at 25°C is the most severe condition for the
ADGM3144 ∆RON over actuations.
Figure 67. Population vs. Absolute RON, Switch Actuated at 85°C and RON
Measured at 25°C, Actuation Frequency = 289Hz, VDD = 3.3V
HOT SWITCHING
Hot switching occurs by cycling the switch on or off with an exces-
sive voltage or current applied to the switch. The presence of
the applied signal during the switching cycle damages the switch
contacts. Hot switching damage is dependent on the current or the
voltage levels. Hot switching causes a significant reduction in the
cycle lifetime of the switch, as shown in Figure 71 and Figure 73.
Figure 68 shows the hot switching condition when the switch is
turned on with 1V present at the switch terminal during switching.
With a voltage across an off switch, damage can occur as the
contact or switch closes.
Figure 68. Hot Switching Condition When Turning the Switch from Off to On
Figure 69 shows the hot switching condition when the switch is
turned off with 10mA passing through the switch during switching.
With current passing through an on switch, damage can occur as
the contact or switch opens.
Figure 69. Hot Switching Condition When Turning the Switch from On to Off



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