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SDI565047-R47F Datasheet(PDF) 3 Page - Superworld Electronics

Part # SDI565047-R47F
Description  WIREWOUND CHIP INDUCTORS
PDF  7 Pages
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Manufacturer  SUPERWORLD [Superworld Electronics]
Direct Link  http://www.superworld.com.sg
Logo SUPERWORLD - Superworld Electronics

SDI565047-R47F Datasheet(HTML) 3 Page - Superworld Electronics

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Temp
MIL-STD-202G Method 108A
Time
T
More than 95% of termincal electrode should
SUPERWORLD ELECTRONICS (S) PTE LTD
NOTE : Specifications subject to change without notice. Please check our website for latest information.
MIL-STD-202G Method 208H
Physical Characteristics Tests
Reference documents:
IPC J-STD-002B
Solderability Test
be covered with solder.
PG. 3
31.07.2008
Solder : Sn(63)/Pb(37)
Flux : rosin flux
Dip time : 5 secs.
Solder temperature : 245±5°C
-40°C
1. No case deformation or change in appearance.
1. No case deformation or change in appearance.
1. No case deformation or change in appearance.
Reference documents:
MIL-STD-202G Method 107G
Thermal shock test
Reference documents:
4. DCR/DCR<10%
T : weight< 28g : 15 Min.
28g<weight<136g : 30 Min.
2. L/L<30% (Closed Magnetic Circuit)
3. Q/Q < 30%
L/L<10%
MIL-STD-202G Method 103B
4. DCR/DCR<10%
3. Q/Q < 30%
3. Q/Q < 30%
Humidity Test
IEC 68-2-1A 6.1 6.2
2. L/L<30% (Closed Magnetic Circuit)
L/L<10%
4. DCR/DCR<10%
Low Temperature Storage Test
Reference documents:
2. L/L<30% (Closed Magnetic Circuit)
L/L<10%
4. DCR/DCR<10%
Change time < 5 min
Room
Temp
0
Temp
125°C
Conditions of 1 cycle :
Step 2 : 125°C for T time
Step 1 : -40°C for T time
Total : 20 cycles
T
Tested after 1 hour (less than 2 hours) at room temperature
Tested while the specimens are still in the chamber
96H
High temperature
93%RH
0
High humidity
Time : 96±2 hours
Temp & Humidity
40°C
Conditions
1H
Test Time
Room
Dry oven at temperature of 40±5°C for 24 hours
Exposure : Temperature : 40±2°C, Humidity : 93±3% RH,
Temp
Measured after 24 hours
Low temperature
0
-25°C
Room
Temp
96H
Test
Time
96H
Tested after 1 hour (less than 2 hours) at room temperature
Temperature : -25±2°C
Time : 96±2 hours
Room
0
Temp
High temperature
85°C
Test
1H
Time
1. No case deformation or change in appearance.
High Temperature Storage Test
6. RELIABILITY AND TEST CONDITION :
Reference documents:
Environmental Tests
ITEM
2. L/L<30% (Closed Magnetic Circuit)
L/L<10%
3. Q/Q < 30%
PERFORMANCE
Tested after 1 hour (less than 2 hours) at room temperature
TEST CONDITION
Temperature : 85±2°C
Time : 96±2 hours
SDI565047 SERIES
WIREWOUND CHIP INDUCTORS



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