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11/12/98

SPT9110

ELECTRICAL SPECIFICATIONS

TEST

TEST

SPT9110

PARAMETERS

CONDITIONS

LEVEL

MIN

TYP

MAX

UNITS

Track Mode Dynamics

Bandwidth (-3 dB)

+25

°C

Single Ended Out

V

220

MHz

Differential Out

V

140

MHz

Slew Rate 2.0 Vp-p Output Step

+25

°C

Single Ended Out

20 pF Load

IV

580

V/

µs

20 pF Load

IV

800

V/

µs

Input RMS Spectral Noise

Single Ended

V

3.5

nV/ Hz

Differential

V

13.0

nV/ Hz

Track-to-Hold Switching

Aperture Delay

+25

°C

V

250

ps

Aperture Jitter

+25

°C

V

<1

ps rms

Pedestal Offset

+25

°CIV

±12

mV

Full Temperature

V

±12

mV

Worst Harmonic

5 MHz, 50 MSPS, Single-Ended

IV

-64

-68

dB

V

-64

dB

Worst Harmonic

5 MHz, 50 MSPS, Differential

IV

-61

-65

dB

V

-63

dB

Worst Harmonic

25 MHz, 50 MSPS, Single-Ended

V

-66

dB

V

-63

dB

Worst Harmonic

25 MHz, 50 MSPS, Differential

V

-64

dB

V

-60

dB

Worst Harmonic

50 MHz, 100 MSPS, Single-Ended

IV

-54

-58

dB

V

-54

dB

Worst Harmonic

50 MHz, 100 MSPS, Differential

IV

-50

-54

dB

V

-50

dB

+25

°C

V

400

MHz

+25

°C

V

mV/s

+25

°CIV

±40

mV/

µs

Full Temperature

IV

±80

mV/

µs

Feedthrough Rejection (50 MHz)

Full Temperature

V

-65

dB

4. For hold times longer than 50 ns, the input common mode voltage may affect the hold mode distortion. (This is due to nonlinear

application of the hold signal.

5. Sampling bandwidth is defined as the -3 dB frequency response of the input sampler to the hold capacitor when operating in the

sampling mode. It is greater than tracking bandwidth because it does not include the bandwidth of the output amplifier.

6. Hold mode noise is proportional to the length of time a signal is held. This value must be combined with the track mode noise to

obtain total noise.

7. Optimized for hold mode performance and low power.

droop that varies with VCM.) For optimal performance, CADEKA recommends that the held output signal be used within 50 ns of the