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PIC18F2420-E/P Datasheet(PDF) 339 Page - Microchip Technology |
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PIC18F2420-E/P Datasheet(HTML) 339 Page - Microchip Technology |
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339 / 412 page ![]() © 2008 Microchip Technology Inc. DS39631E-page 337 PIC18F2420/2520/4420/4520 TABLE 26-1: MEMORY PROGRAMMING REQUIREMENTS DC CHARACTERISTICS Standard Operating Conditions (unless otherwise stated) Operating temperature -40°C ≤ TA ≤ +85°C for industrial Param No. Sym Characteristic Min Typ† Max Units Conditions Data EEPROM Memory D120 ED Byte Endurance 100K 1M — E/W -40 °C to +85°C D121 VDRW VDD for Read/Write VMIN — 5.5 V Using EECON to read/write VMIN = Minimum operating voltage D122 TDEW Erase/Write Cycle Time — 4 — ms D123 TRETD Characteristic Retention 40 — — Year Provided no other specifications are violated D124 TREF Number of Total Erase/Write Cycles before Refresh(1) 1M 10M — E/W -40°C to +85°C D125 IDDP Supply Current during Programming —10— mA Program Flash Memory D130 EP Cell Endurance 10K 100K — E/W -40 °C to +85°C D131 VPR VDD for Read VMIN —5.5 V VMIN = Minimum operating voltage D132 VIE VDD for Block Erase 3.0 — 5.5 V Using ICSP™ port, +25 °C D132A VIW VDD for Externally Timed Erase or Write 4.5 — 5.5 V Using ICSP™ port, +25 °C D132B VPEW VDD for Self-Timed Write VMIN —5.5 V VMIN = Minimum operating voltage D133 TIE ICSP Block Erase Cycle Time —4— ms VDD ≥ 4.5V D133A TIW ICSP Erase or Write Cycle Time (externally timed) 1— — ms VDD ≥ 4.5V, +25°C D133A TIW Self-Timed Write Cycle Time — 2 — ms D134 TRETD Characteristic Retention 40 100 — Year Provided no other specifications are violated D135 IDDP Supply Current during Programming —10— mA † Data in “Typ” column is at 5.0V, 25°C unless otherwise stated. These parameters are for design guidance only and are not tested. Note 1: Refer to Section 7.8 “Using the Data EEPROM” for a more detailed discussion on data EEPROM endurance. |
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