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H7N1002LS Datasheet(PDF) 4 Page - Renesas Technology Corp |
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H7N1002LS Datasheet(HTML) 4 Page - Renesas Technology Corp |
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4 / 9 page ![]() H7N1002LD, H7N1002LS, H7N1002LM Preliminary REJ03G1131-0800 Rev.8.00 Nov 13, 2009 Page 4 of 8 Case Temperature Tc (°C) Static Drain to Source on State Resistance vs. Temperature Drain Current ID (A) Forward Transfer Admittance vs. Drain Current 40 –400 40 80120 160 0 8 16 24 32 10 V VGS = 4.5 V 50 A ID = 10 A, 20 A 50 A 10 A, 20 A Pulse Test 0.01 0.11 10 10 200 100 1 0.1 0.02 75°C 25°C 100 VDS = 10 V Pulse Test Reverse Drain Current IDR (A) Body to Drain Diode Reverse Recovery Time Drain to Source Voltage VDS (V) Typical Capacitance vs. Drain to Source Voltage Gate Charge Qg (nc) Dynamic Input Characteristics Drain Current ID (A) Switching Characteristics 1 0.10.3 3 10 30 100 100 50 20 10 di / dt = 100 A / μs VGS = 0, Ta = 25°C 010 20 30 40 50 500 1000 5000 2000 100 50 200 20 10000 20000 200 0 20 80160240320 400 0 4 8 12 16 0 40 80 120 160 ID = 75 A VGS VDS 1000 100 300 30 10 1 3 0.10.3 3 10 100 30 1 tr td(on) td(off) tf VDD = 80 V 50 V 25 V VDD = 25 V 50 V 80 V VGS = 0 f = 1 MHz Ciss Coss Crss Tc = –25°C VGS = 10 V, VDD = 30 V PW = 5 μs, duty ≤ 1 % Rg = 4.7 Ω |
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