Electronic Components Datasheet Search
  New Zealand  ▼
ALLDATASHEET.CO.NZ

X  

CM4532R18ML Datasheet(PDF) 7 Page - ABC Taiwan Electronics Corp

Part # CM4532R18ML
Description  WOUND CHIP INDUCTOR
PDF  8 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
Manufacturer  ABC [ABC Taiwan Electronics Corp]
Direct Link  http://www.atec-group.com
Logo ABC - ABC Taiwan Electronics Corp

CM4532R18ML Datasheet(HTML) 7 Page - ABC Taiwan Electronics Corp

  CM4532R18ML Datasheet HTML 1Page - ABC Taiwan Electronics Corp CM4532R18ML Datasheet HTML 2Page - ABC Taiwan Electronics Corp CM4532R18ML Datasheet HTML 3Page - ABC Taiwan Electronics Corp CM4532R18ML Datasheet HTML 4Page - ABC Taiwan Electronics Corp CM4532R18ML Datasheet HTML 5Page - ABC Taiwan Electronics Corp CM4532R18ML Datasheet HTML 6Page - ABC Taiwan Electronics Corp CM4532R18ML Datasheet HTML 7Page - ABC Taiwan Electronics Corp CM4532R18ML Datasheet HTML 8Page - ABC Taiwan Electronics Corp  
Zoom Inzoom in Zoom Outzoom out
 7 / 8 page
background image
Climatic test
-40±2℃
+125±2℃
30 mins
30 mins
1﹒Temp:40±2℃
evidence of short or
open circuiting
Unless otherwise specified , Allow the specimen to stand at room temperature
for 1 hour or more but not more than 2 hours , Measure the electrical and
AR-001A
Note:
Humidity load life
mechanical performances
2﹒R.H.:90 -- 95%
3﹒Time:1000±12 hours
4﹒Load:Allowed DC current
1﹒Inductors shall be
no evidence of
electrical and
2﹒Inductance shall
than ±10%
3﹒Q shall not
change more than ±20%
There shall be no
not change more
Dry heat test
Thermal shock test
High temperature
load life test
characteristic
Temperature
Humidity test
Cold test
damage
15 mins
Total:5 cycles
1﹒Temp:85±2℃
1﹒Temp:85±2℃
2﹒Time:96±2 hours
2﹒Time:1000±12 hours
3﹒Load:Allowed DC current
15 mins
Room temp
-40
-- +125
℃℃
1﹒Temp:40±2℃
2﹒R.H.:90 -- 95%
1﹒Temp:-25±2℃
3﹒Time:96±2 hours
2﹒Time:96±2 hours
mechanical
Room temp
A 0.5kg load shall be applied to both
After fluxing,Inductor shall be dipped in
a melted solder bath at 240±5
for
℃
SPECIFICATION FOR APPROVAL
CM4532□□□□L□-□□□
WOUND CHIP INDUCTOR
Terminal shall not
The terminal shall
be at least 90%
covered with solder
There shall be no
case deformation
appearance or obliteration
be loosened or
Resistance to
Solderability test
solvent test
of marking
change in
strength-pull
Terminal
NAME
PROD.
test
5 seconds﹒
MIL-STD-202F,Method 215D
ABC'S ITEM NO.
ABC'S DWG NO.
1 minute﹒
Terminals in the axis direction for
ruptured
REF :
PAGE: 7
20070813-E



Html Pages

1 2 3 4 5 6 7 8


Datasheet Download

Go To PDF Page


Link URL



Does ALLDATASHEET help your business so far?  [ DONATE ] 

About Alldatasheet   |   Advertisement   |   Contact us   |   Privacy Policy   |   Link to Datasheet    |   Link Exchange   |   Manufacturer List
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com