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ZR431LC01STOB Datasheet(PDF) 4 Page - Diodes Incorporated |
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ZR431LC01STOB Datasheet(HTML) 4 Page - Diodes Incorporated |
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4 / 10 page ![]() ZR431L Issue 3 - April 2008 4 www.zetex.com © Zetex Semiconductors plc 2008 Electrical characteristics (at Tamb = 25°C unless otherwise stated) DC Test circuits Parameter Symbol Min. Typ. Max. Unit Conditions Reference Voltage 2.5% 1.0% Vref Vref 1.209 1.228 1.24 1.24 1.271 1.252 V V IL = 10mA (Fig1), VZ = Vref Deviation of Reference Input Voltage over Temperature Vdev 4.0 8.0 mV IL = 10mA, VZ = Vref Ta = full range (Fig 1) Ratio of the change in Reference Voltage to the change in Cathode Voltage) 0.5 2.0 mV/V VZ from Vref to 10V IZ = 10mA (Fig2) Reference Input Current Iref 0.02 0.11 0.4 A R1 = 10k, R2 = O/C, lL = 10mA (fig2) Deviation of Reference Input Current over Temperature Iref 0.02 0.2 A R1 = 10k, R2 = O/C, IL = 10mA Ta = full range (Fig2) Minimum Cathode Current for Regulation IZmin 30 100 A Off-state Current IZoff 10 30 AVZ = 10V, Vref = 0V (Fig3) Dynamic Output Impedance RZ 0.25 2 Ω VZ = Vref(Fig1), f = 0Hz, IL = 10mA Fig 1 - Test Circuit for VZ = Vref Fig 2 - Test Circuit for VZ > Vref Fig 3 - Test Circuit for Off State current Z ref V V Δ Δ |
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