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R5F562TADDFH Datasheet(PDF) 85 Page - Renesas Technology Corp

Part # R5F562TADDFH
Description  100-MHz 32-bit RX MCUs, FPU, 165 DMIPS, 12-bit ADC
PDF  94 Pages
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Manufacturer  RENESAS [Renesas Technology Corp]
Direct Link  http://www.renesas.com
Logo RENESAS - Renesas Technology Corp

R5F562TADDFH Datasheet(HTML) 85 Page - Renesas Technology Corp

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R01DS0096EJ0100 Rev.1.00
Page 85 of 92
Apr 20, 2011
RX62T Group
5. Electrical Characteristics
5.7
ROM (Flash Memory for Code Storage) Characteristics
Note 1. Definition of rewrite/erase cycle:
The rewrite/erase cycle is the number of erasing for each block. When the rewrite/erase cycle is n times (n = 1000), erasing can
be performed n times for each block. For instance, when 256-byte writing is performed 16 times for different addresses in 4-
Kbyte block and then the entire block is erased, the rewrite/erase cycle is counted as one. However, writing to the same address
for several times as one erasing is not enabled (overwriting is prohibited).
Note 2. This indicates the minimum number that guarantees the characteristics after rewriting. (The guaranteed value is in the range
from one to the minimum number.)
Note 3. This indicates the characteristic when rewrite is performed within the specification range including the minimum number.
Table 5.19
ROM (Flash Memory for Code Storage) Characteristics
Note:Items for which test conditions are not specifically stated in the table below have the same values under conditions 1 to 3.
Condition 1: VCC = PLLVCC = 2.7 to 3.6 V, VSS = PLLVSS = AVSS0 = AVSS = VREFL0 = 0 V
AVCC0 = AVCC = 3.0 to 3.6 V, VREFH0 = 3.0 V to AVCC0, VREF = 3.0 V to AVCC
Condition 2: VCC = PLLVCC = 2.7 to 3.6 V, VSS = PLLVSS = AVSS0 = AVSS = VREFL0 = 0 V
AVCC0 = AVCC = 4.0 to 5.5 V, VREFH0 = 4.0 V to AVCC0, VREF = 4.0 V to AVCC
Condition 3: VCC = PLLVCC = 4.0 to 5.5 V, VSS = PLLVSS = AVSS0 = AVSS = VREFL0 = 0 V
AVCC0 = AVCC = 4.0 to 5.5 V, VREFH0 = 4.0 V to AVCC0, VREF = 4.0 V to AVCC
Temperature range for the programming/erasure operation:
Ta = -40 to +85°C. Ta is the same under conditions 1 to 3.
Item
Symbol
Min.
Typ.
Max.
Unit
Test Conditions
Programming time
256 bytes
tP256
-
2
12
ms
PCLK = 50 MHz
NPEC  100
4 Kbytes
tP4K
-
2350ms
16 Kbytes
tP16K
-
90
200
ms
256 byte
tP256
-
2.4
14.4
ms
PCLK = 50 MHz
NPEC > 100
4 Kbytes
tP4K
-
27.6
60
ms
16 Kbytes
tP16K
-
108
240
ms
Erasure time
4 Kbytes
tE4K
-
2560ms
PCLK = 50 MHz
NPEC  100
16 Kbytes
tE16K
-
100
240
ms
4 Kbytes
tE4K
-
3072ms
PCLK = 50 MHz
NPEC > 100
16 Kbytes
tE16K
-
120
288
ms
Rewrite/erase cycle*1
NPEC
1000*2
--Times
Suspend delay time during writing
tSPD
-
-
120
s
Figure 5.24
PCLK = 50 MHz
First suspend delay time during
erasing (in suspend priority mode)
tSESD1
-
-
120
s
Second suspend delay time during
erasing (in suspend priority mode)
tSESD2
--1.7
ms
Suspend delay time during erasing
(in erasure priority mode)
tSEED
--1.7
ms
Data hold time*3
tDRP
10
-
-
Year



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