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SST30VR021 Datasheet(PDF) 4 Page - Silicon Storage Technology, Inc |
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SST30VR021 Datasheet(HTML) 4 Page - Silicon Storage Technology, Inc |
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4 / 12 page ![]() 4 Data Sheet 2 Mbit ROM + 1 Mbit / 2Mbit / 256 Kbit SRAM ROM/RAM Combo SST30VR021 / SST30VR022 / SST30VR023 ©2001 Silicon Storage Technology, Inc. S71135-02-000 4/01 380 FIGURE 2: AC INPUT/OUTPUT REFERENCE WAVEFORMS FIGURE 3: A TEST LOAD EXAMPLE TABLE 4: CAPACITANCE (Ta = 25°C, f=1 Mhz) Parameter Description Test Condition Maximum CI/O1 I/O Pin Capacitance VI/O = 0V 8 pF CIN1 Input Capacitance VIN = 0V 6 pF T4.1 380 1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter. 380 ILL F08.0 REFERENCE POINTS OUTPUT INPUT VIT VIHT VILT VOT AC test inputs are driven at VIHT (0.9 VDD) for a logic “1” and VILT (0.1 VDD) for a logic “0”. Measurement reference points for inputs and outputs are VIT (0.5 VDD) and VOT (0.5 VDD). Input rise and fall times (10% ↔ 90%) are <5 ns. Note: VIT - VINPUT Test VOT - VOUTPUT Test VIHT - VINPUT HIGH Test VILT - VINPUT LOW Test 380 ILL F09.0 TO TESTER TO DUT CL |
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