BQ28Z560-R1 datasheet(8/60 Pages) TI1

8 / 60 page

bq28z560-R1

SLUSBD3 – APRIL 2013

www.ti.com

INTERNAL TEMPERATURE SENSOR CHARACTERISTICS

TA = –40 to +85ºC, VBAT = 2.7 V to 5.5 V; Typical values stated, where TA = 25ºC and VBAT = 3.6 V (unless otherwise noted)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

GTEMP

Temperature sensor voltage gain

–2.0

mV/°C

HIGH FREQUENCY OSCILLATOR

TA = –40 to +85ºC, VBAT = 2.7 V to 5.5 V; Typical values stated, where TA = 25ºC and VBAT = 3.6 V (unless otherwise noted)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

f(OSC)

Operating frequency

2.097

MHz

TA = 0°C to 60°C

–2.0

0.38

2.0

f(EIO)

Frequency error (1), (2)

TA = –20°C to 70°C

–3.0

0.38

3.0

TA = –40°C to 85°C

–4.5

0.38

4.5

t(SXO)

Start-up time (3)

2.5

(1)

The frequency error is measured from 2.097 MHz.

(2)

The frequency drift is included and measured from the trimmed frequency at VCC = 2.5 V, TA = 25°C.

(3)

The startup time is defined as the time it takes for the oscillator output frequency to be ±3%.

LOW FREQUENCY OSCILLATOR

TA = –40 to +85ºC, VBAT = 2.7 V to 5.5 V; Typical values stated, where TA = 25ºC and VBAT = 3.6 V (unless otherwise noted)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

f(LOSC)

Operating frequency

32.768

kHz

TA = 0°C to 60°C

–1.5

0.25

1.5

f(LEIO)

Frequency error (1), (2)

TA = –20°C to 70°C

–2.5

0.25

2.5

TA = –40°C to 85°C

–4.0

0.25

4.0

t(LSXO)

Start-up time (3)

500

μs

(1)

The frequency drift is included and measured from the trimmed frequency at VCC = 2.5 V, TA = 25°C.

(2)

The frequency error is measured from 32.768 kHz.

(3)

The startup time is defined as the time it takes for the oscillator output frequency to be ±3%.

INTEGRATING ADC (COULOMB COUNTER) CHARACTERISTICS

TA = –40 to +85ºC, VBAT = 2.7 V to 5.5 V; Typical values stated, where TA = 25ºC and VBAT = 3.6 V (unless otherwise noted)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Input voltage range, V(SRN) and

VIN(SR)

VSR = V(SRN) – V(SRP)

–0.125

0.125

V(SRP)

Conversion time

Single conversion

tCONV(SR)

Resolution

bits

VOS(SR)

Input offset

µV

INL

Integral non-linearity error

±0.007

±0.034

FSR

ZIN(SR)

Effective input resistance(1)

2.5

Ω

Ilkg(SR)

Input leakage current(1)

0.3

µA

(1)

Specified by design. Not production tested.

ADC (TEMPERATURE AND CELL VOLTAGE) CHARACTERISTICS

TA = –40 to +85ºC, VBAT = 2.7 V to 5.5 V; Typical values stated, where TA = 25ºC and VBAT = 3.6 V (unless otherwise noted)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

VIN(ADC)

Input voltage range

–0.2

Conversion time

125

tCONV(ADC)

Resolution

bits

VOS(ADC)

Input offset

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