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MKT1813-422-014-R Datasheet(PDF) 13 Page - Vishay Siliconix |
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MKT1813-422-014-R Datasheet(HTML) 13 Page - Vishay Siliconix |
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13 / 15 page ![]() MKT1813 www.vishay.com Vishay Roederstein Revision: 04-Jul-13 13 Document Number: 26013 For technical questions, contact: dc-film@vishay.com THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000 SUB-GROUP C1B PART OF SAMPLE OF SUB-GROUP C1 4.9 Shock Mounting: See section “Mounting” of this specification Pulse shape: Half sine Acceleration: 490 m/s2 Duration of pulse: 11 ms 4.9.3 Final measurements Visual examination No visible damage Capacitance | C/C| 3 % of the value measured in 4.6.1 Tangent of loss angle Increase of tan 0.005 for: C 100 nF or 0.010 for: 100 nF < C 220 nF or 0.015 for: 220 nF < C 470 nF and 0.003 for: C > 470 nF Compared to values measured in 4.6.1 Insulation resistance As specified in section “Insulation Resistance” of this specification SUB-GROUP C1 COMBINED SAMPLE OF SPECIMENS OF SUB-GROUPS C1A AND C1B 4.10 Climatic sequence 4.10.2 Dry heat Temperature: + 100 °C Duration: 16 h 4.10.3 Damp heat cyclic Test Db, first cycle 4.10.4 Cold Temperature: - 55 °C Duration: 2 h 4.10.6 Damp heat cyclic Test Db, remaining cycles 4.10.6.2 Final measurements Voltage proof = URDC for 1 min within 15 min after removal from testchamber No breakdown of flash-over Visual examination No visible damage Legible marking Capacitance | C/C| 5 % of the value measured in 4.4.2 or 4.9.3 Tangent of loss angle Increase of tan 0.007 for: C 100 nF or 0.010 for: 100 nF < C 220 nF or 0.015 for: 220 nF < C 470 nF and 0.005 for: C > 470 nF Compared to values measured in 4.3.1 or 4.6.1 Insulation resistance 50 % of values specified in section “Insulation resistance” of this specification SUB-GROUP C2 4.11 Damp heat steady state 56 days, 40 °C, 90 % to 95 % RH 4.11.1 Initial measurements Capacitance Tangent of loss angle at 1 kHz GROUP C INSPECTION REQUIREMENTS SUB-CLAUSE NUMBER AND TEST CONDITIONS PERFORMANCE REQUIREMENTS |
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