LM10QML datasheet(3/28 Pages) NSC

3 / 28 page

LM10QML

www.ti.com

SNOSAP1A – OCTOBER 2010 – REVISED MARCH 2013

Absolute Maximum Ratings

(1)

Total Supply Voltage

45V

Differential Input Voltage (2)

±40V

Power Dissipation (PDmax)

(3)

Internally Limited

Output Short-circuit Duration (4)

Continuous

Storage Temperature Range

−55°C ≤ TA ≤ +150°C

Maximum Junction Temperature (TJmax)

150°C

Lead Temperature

(Soldering 10 seconds)

300°C

Thermal Resistance

θJA

Still Air

150°C

500LF/Min Air flow

45°C

θJC

45°C

ESD

Rating to be determined

(1)

Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for

which the device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the

Electrical Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may

degrade when the device is not operated under the listed test conditions.

(2)

The Input voltage can exceed the supply voltages provided that the voltage from the input to any other terminal does not exceed the

maximum differential input voltage and excess dissipation is accounted for when VI< VS

(3)

The maximum power dissipation must be derated at elevated temperatures and is dictated by TJmax (maximum junction temperature),

θJA (package junction to ambient thermal resistance), and TA (ambient temperature). The maximum allowable power dissipation at any

temperature is PDmax = (TJmax - TA)/θJA or the number given in the Absolute Maximum Ratings, whichever is lower..

(4)

Internal thermal limiting prevents excessive heating that could result in sudden failure, but the IC can be subjected to accelerated stress

with a shorted output and worst-case conditions.

Quality Conformance Inspection

Mil-Std-883, Method 5005 - Group A

Subgroup

Description

Temp °C

Static tests at

+25

Static tests at

+125

Static tests at

-55

Dynamic tests at

+25

Dynamic tests at

+125

Dynamic tests at

-55

Functional tests at

+25

Functional tests at

+125

Functional tests at

-55

Switching tests at

+25

Switching tests at

+125

Switching tests at

-55

Settling time at

+25

Settling time at

+125

Settling time at

-55

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